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Dirk Sonksen
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Schoffengrund, DE
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Patents Grants
last 30 patents
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Patent Grant
Device and method for inspecting an object
Patent number
7,271,889
Issue date
Sep 18, 2007
Leica Microsystems CMS GmbH
Franz Cemic
G01 - MEASURING TESTING
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Patent Grant
Method and apparatus for scanning a specimen using an optical imagi...
Patent number
7,247,825
Issue date
Jul 24, 2007
Vistec Semiconductor Systems GmbH
Dirk Sönksen
G02 - OPTICS
Patents Applications
last 30 patents
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Patent Application
Device and method for inspecting an object
Publication number
20050259245
Publication date
Nov 24, 2005
LECIA MICROSYSTEMS SEMICONDUCTOR GmbH
Franz Cemic
G02 - OPTICS
Information
Patent Application
Method and apparatus for scanning a specimen using an optical imagi...
Publication number
20040129859
Publication date
Jul 8, 2004
Leica Microsystems Semiconductor GmbH
Dirk Sonksen
G02 - OPTICS