Dirk VAN DYCK

Person

Aartselaar, BE

People

Patents Grantslast 30 patents

Information Patent Grant
Method for subtracting background light from an exposure value of a...
- Patent number 11,543,501
- Issue date Jan 3, 2023
- XENOMATIX NV
- Dirk Van Dyck
- G01 - MEASURING TESTING
Information Patent Grant
System and method for determining a distance to an object
- Patent number 11,513,199
- Issue date Nov 29, 2022
- XENOMATIX NV
- Dirk Van Dyck
- G01 - MEASURING TESTING
Information Patent Grant
System for determining a distance to an object
- Patent number 11,029,391
- Issue date Jun 8, 2021
- XENOMATIX NV
- Rik Paesen
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
System and method for determining a distance to an object
- Patent number 10,921,454
- Issue date Feb 16, 2021
- XENOMATIX NV
- Dirk Van Dyck
- G01 - MEASURING TESTING
Information Patent Grant
System for determining a distance to an object
- Patent number 10,852,400
- Issue date Dec 1, 2020
- XENOMATIX NV
- Dirk Van Dyck
- G01 - MEASURING TESTING
Information Patent Grant
System and method for determining a distance to an object
- Patent number 10,768,301
- Issue date Sep 8, 2020
- XENOMATIX NV
- Filip Geuens
- G01 - MEASURING TESTING
Information Patent Grant
Pixel structure
- Patent number 10,764,518
- Issue date Sep 1, 2020
- XENOMATIX NV
- Dirk Van Dyck
- G01 - MEASURING TESTING
Information Patent Grant
Surround sensing system with telecentric optics
- Patent number 10,183,541
- Issue date Jan 22, 2019
- XENOMATIX NV
- Johan Van Den Bossche
- B60 - VEHICLES IN GENERAL
Information Patent Grant
Surround sensing system
- Patent number 9,551,791
- Issue date Jan 24, 2017
- XENOMATIX NV
- Johan Van Den Bossche
- G01 - MEASURING TESTING
Information Patent Grant
High-resolution amplitude contrast imaging
- Patent number 9,412,558
- Issue date Aug 9, 2016
- Universiteit Antwerpen
- Dirk Van Dyck
- G01 - MEASURING TESTING
Information Patent Grant
Pattern recognition using contextual correlation
- Patent number 6,707,941
- Issue date Mar 16, 2004
- Dirk Ernest Maria Van Dyck
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Phase contrast aberroscope
- Patent number 6,002,484
- Issue date Dec 14, 1999
- Jos J. Rozema
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE

Patents Applicationslast 30 patents

Information Patent Application
INTRAOCULAR LENS
- Publication number 20240407912
- Publication date Dec 12, 2024
- UNIVERSITEIT ANTWERPEN
- Dirk VAN DYCK
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Application
METHOD AND DEVICE FOR DETERMINING DISTANCES TO A SCENE
- Publication number 20220326358
- Publication date Oct 13, 2022
- XENOMATIX NV
- Rik PAESEN
- G01 - MEASURING TESTING
Information Patent Application
A PIXEL STRUCTURE
- Publication number 20200137330
- Publication date Apr 30, 2020
- XENOMATIX NV
- Dirk VAN DYCK
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
SYSTEM AND METHOD FOR DETERMINING A DISTANCE TO AN OBJECT
- Publication number 20200124726
- Publication date Apr 23, 2020
- XENOMATIX NV
- Filip GEUENS
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM FOR DETERMINING A DISTANCE TO AN OBJECT
- Publication number 20200033457
- Publication date Jan 30, 2020
- XENOMATIX NV
- Dirk VAN DYCK
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM AND METHOD FOR DETERMINING A DISTANCE TO AN OBJECT
- Publication number 20200033478
- Publication date Jan 30, 2020
- XENOMATIX NV
- Dirk VAN DYCK
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM FOR DETERMINING A DISTANCE TO AN OBJECT
- Publication number 20200034644
- Publication date Jan 30, 2020
- XENOMATIX NV
- Rik PAESEN
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD FOR SUBTRACTING BACKGROUND LIGHT FROM AN EXPOSURE VALUE OF A...
- Publication number 20200025894
- Publication date Jan 23, 2020
- XENOMATIX NV
- Dirk VAN DYCK
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM AND METHOD FOR DETERMINING A DISTANCE TO AN OBJECT
- Publication number 20180299554
- Publication date Oct 18, 2018
- XENOMATIX NV
- Dirk VAN DYCK
- G01 - MEASURING TESTING
Information Patent Application
SURROUND SENSING SYSTEM WITH TELECENTRIC OPTICS
- Publication number 20160200161
- Publication date Jul 14, 2016
- XenomatiX NV
- Johan VAN DEN BOSSCHE
- B60 - VEHICLES IN GENERAL
Information Patent Application
SURROUND SENSING SYSTEM
- Publication number 20160018526
- Publication date Jan 21, 2016
- XENOMATIX BVBA
- Johan VAN DEN BOSSCHE
- G01 - MEASURING TESTING
Information Patent Application
High - Resolution Amplitude Contrast Imaging
- Publication number 20150380211
- Publication date Dec 31, 2015
- UNIVERSITEIT ANTWERPEN
- Dirk VAN DYCK
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Methods and Systems for Material Characterization
- Publication number 20140149052
- Publication date May 29, 2014
- ITM POWER (RESEARCH) LIMITED
- Dirk Van Dyck
- G01 - MEASURING TESTING

Dirk VAN DYCK

Person

Patents Grantslast 30 patents

Method for subtracting background light from an exposure value of a...

System and method for determining a distance to an object

System for determining a distance to an object

System and method for determining a distance to an object

System for determining a distance to an object

System and method for determining a distance to an object

Pixel structure

Surround sensing system with telecentric optics

Surround sensing system

High-resolution amplitude contrast imaging

Pattern recognition using contextual correlation

Phase contrast aberroscope

Patents Applicationslast 30 patents

INTRAOCULAR LENS

METHOD AND DEVICE FOR DETERMINING DISTANCES TO A SCENE

A PIXEL STRUCTURE

SYSTEM AND METHOD FOR DETERMINING A DISTANCE TO AN OBJECT

SYSTEM FOR DETERMINING A DISTANCE TO AN OBJECT

SYSTEM AND METHOD FOR DETERMINING A DISTANCE TO AN OBJECT

SYSTEM FOR DETERMINING A DISTANCE TO AN OBJECT

METHOD FOR SUBTRACTING BACKGROUND LIGHT FROM AN EXPOSURE VALUE OF A...

SYSTEM AND METHOD FOR DETERMINING A DISTANCE TO AN OBJECT

SURROUND SENSING SYSTEM WITH TELECENTRIC OPTICS

SURROUND SENSING SYSTEM

High - Resolution Amplitude Contrast Imaging

Methods and Systems for Material Characterization