Dirk Wolansky

Person

  • Frankfurt, DE

Patents Grantslast 30 patents

  • Information Patent Grant

    Technological method for preventing, by means of buried etch stop l...

    • Patent number 10,832,953
    • Issue date Nov 10, 2020
    • IHP GmbH—Innovations for High Performance Microelectronics/Leibniz-Institut f...
    • Matthias Wietstruck
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Grant

    MEMS-microviscometer

    • Patent number 9,638,617
    • Issue date May 2, 2017
    • IHP GmbH—Innovations for High Performance Microelectronics/Leibniz-Institut f...
    • Mario Birkholz
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Layers in substrate wafers

    • Patent number 7,595,534
    • Issue date Sep 29, 2009
    • IHP GmbH-Innovations for High Performance Microelectronics/Institut fur Innov...
    • Bernd Heinemann
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Grant

    Method and device for the production of thin epitaxial semiconducto...

    • Patent number 7,244,667
    • Issue date Jul 17, 2007
    • IHP GmbH - Innovations for High Performance Microelectronics
    • Bernd Tillack
    • C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
  • Information Patent Grant

    Bipolar transistor and method for producing same

    • Patent number 6,465,318
    • Issue date Oct 15, 2002
    • Institut fuer Halbleiterphysik Franfurt (Oder) GmbH
    • Karl-Ernst Ehwald
    • H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents