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Dirk Woll
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San Jose, CA, US
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Patents Grants
last 30 patents
Information
Patent Grant
Wafer inspection
Patent number
10,488,348
Issue date
Nov 26, 2019
KLA-Tencor Corp.
Anatoly Romanovsky
G01 - MEASURING TESTING
Information
Patent Grant
Oven enclosure for optical components with integrated purge gas pre...
Patent number
10,153,215
Issue date
Dec 11, 2018
KLA-Tencor Corporation
Dirk Woll
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Grant
Power-scalable nonlinear optical wavelength converter
Patent number
10,120,262
Issue date
Nov 6, 2018
KLA-Tencor Corporation
Dirk Woll
G02 - OPTICS
Information
Patent Grant
Wafer inspection
Patent number
9,915,622
Issue date
Mar 13, 2018
KLA-Tencor Corp.
Anatoly Romanovsky
G01 - MEASURING TESTING
Information
Patent Grant
Power scalable nonlinear optical wavelength converter
Patent number
9,841,655
Issue date
Dec 12, 2017
KLA-Tencor Corporation
Dirk Woll
G02 - OPTICS
Information
Patent Grant
Laser with integrated multi line or scanning beam capability
Patent number
9,678,350
Issue date
Jun 13, 2017
KLA-Tencor Corporation
Christian Wolters
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Grant
Wafer inspection
Patent number
9,279,774
Issue date
Mar 8, 2016
KLA-Tencor Corp.
Anatoly Romanovsky
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
Wafer Inspection
Publication number
20180164228
Publication date
Jun 14, 2018
KLA-Tencor Corporation
Anatoly Romanovsky
G01 - MEASURING TESTING
Information
Patent Application
POWER-SCALABLE NONLINEAR OPTICAL WAVELENGTH CONVERTER
Publication number
20180067377
Publication date
Mar 8, 2018
KLA-Tencor Corporation
Dirk Woll
G02 - OPTICS
Information
Patent Application
OVEN ENCLOSURE FOR OPTICAL COMPONENTS WITH INTEGRATED PURGE GAS PRE...
Publication number
20180040518
Publication date
Feb 8, 2018
KLA-Tencor Corporation
Dirk Woll
G01 - MEASURING TESTING
Information
Patent Application
POWER-SCALABLE NONLINEAR OPTICAL WAVELENGTH CONVERTER
Publication number
20170003572
Publication date
Jan 5, 2017
KLA-Tencor Corporation
Dirk Woll
G02 - OPTICS
Information
Patent Application
Wafer Inspection
Publication number
20150369753
Publication date
Dec 24, 2015
KLA-Tencor Corporation
Anatoly Romanovsky
G01 - MEASURING TESTING
Information
Patent Application
Laser with Integrated Multi Line or Scanning Beam Capability
Publication number
20130250385
Publication date
Sep 26, 2013
KLA-Tencor Corporation
Christian Wolters
G02 - OPTICS
Information
Patent Application
Wafer Inspection
Publication number
20130016346
Publication date
Jan 17, 2013
KLA-Tencor Corporation
Anatoly Romanovsky
G01 - MEASURING TESTING