Ditza Auerbach

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Aseret, IL

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Patents Grantslast 30 patents

Information Patent Grant
System and method for generating spatial signatures
- Patent number 8,553,970
- Issue date Oct 8, 2013
- Applied Materials Israel, Ltd.
- Ditza Auerbach
- G01 - MEASURING TESTING
Information Patent Grant
Wafer defect detection system and method
- Patent number 8,255,172
- Issue date Aug 28, 2012
- Applied Materials Israel, Ltd.
- Ditza Auerbach
- G01 - MEASURING TESTING
Information Patent Grant
System and method for generating spatial signatures
- Patent number 8,254,661
- Issue date Aug 28, 2012
- Applied Materials Israel, Ltd.
- Ditza Auerbach
- G01 - MEASURING TESTING
Information Patent Grant
Method for filtering nuisance defects
- Patent number 7,844,100
- Issue date Nov 30, 2010
- Applied Materials Israel, Ltd.
- Ditza Auerbach
- G01 - MEASURING TESTING
Information Patent Grant
Determination of irradiation parameters for inspection of a surface
- Patent number 7,239,389
- Issue date Jul 3, 2007
- Applied Materials, Israel, Ltd.
- Adam Baer
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
METHOD FOR PROVIDING HIGH RESOLUTION, HIGH CONTRAST FUSED MRI IMAGES
- Publication number 20150077105
- Publication date Mar 19, 2015
- Uri Rapoport
- G01 - MEASURING TESTING
Information Patent Application
System and method for generating spatial signatures
- Publication number 20130051653
- Publication date Feb 28, 2013
- Ditza Auerbach
- G01 - MEASURING TESTING
Information Patent Application
WAFER DEFECT DETECTION SYSTEM AND METHOD
- Publication number 20100076699
- Publication date Mar 25, 2010
- Ditza Auerbach
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM AND METHOD FOR GENERATING SPATIAL SIGNATURES REFERENCE TO RE...
- Publication number 20090324055
- Publication date Dec 31, 2009
- Ditza Auerbach
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Determination of irradiation parameters for inspection of a surface
- Publication number 20060244976
- Publication date Nov 2, 2006
- Adam Baer
- G01 - MEASURING TESTING
Information Patent Application
Method for filtering nuisance defects
- Publication number 20060115143
- Publication date Jun 1, 2006
- Ditza Auerbach
- G06 - COMPUTING CALCULATING COUNTING