Divya Pratap

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Chandler, AZ, US

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Patents Grantslast 30 patents

Information Patent Grant
System and method for evaluating a capacitive interface
- Patent number 9,547,037
- Issue date Jan 17, 2017
- NXP USA, INC.
- Divya Pratap
- G01 - MEASURING TESTING
Information Patent Grant
Method for testing integrated circuit and integrated circuit config...
- Patent number 9,494,646
- Issue date Nov 15, 2016
- FREESCALE SEMICONDUCTOR, INC.
- Divya Pratap
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
METHOD FOR TESTING INTEGRATED CIRCUIT AND INTEGRATED CIRCUIT CONFIG...
- Publication number 20150260785
- Publication date Sep 17, 2015
- FREESCALE SEMICONDUCTOR, INC.
- Divya Pratap
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM AND METHOD FOR EVALUATING A CAPACITIVE INTERFACE
- Publication number 20150233995
- Publication date Aug 20, 2015
- FREESCALE SEMICONDUCTOR, INC.
- DIVYA PRATAP
- G01 - MEASURING TESTING
Information Patent Application
SIGNAL ERROR COMPENSATION FOR A MAGNETOMETER IN A SENSOR PACKAGE
- Publication number 20150115936
- Publication date Apr 30, 2015
- FREESCALE SEMICONDUCTOR, INC.
- Divya Pratap
- G01 - MEASURING TESTING