Djuniadi A. Sagala

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Kyoto, JP

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Patents Grantslast 30 patents

Information Patent Grant
Information processing apparatus, information presentation apparatu...
- Patent number 10,712,192
- Issue date Jul 14, 2020
- Kyocera Corporation
- Yasuhiko Fukuoka
- G01 - MEASURING TESTING
Information Patent Grant
High-frequency module and method of manufacturing the same, and tra...
- Patent number 8,564,478
- Issue date Oct 22, 2013
- Kyocera Corporation
- Djuniadi Arifin Sagala
- G01 - MEASURING TESTING
Information Patent Grant
High-frequency module and method of manufacturing the same, and tra...
- Patent number 8,564,477
- Issue date Oct 22, 2013
- Kyocera Corporation
- Djuniadi Arifin Sagala
- G01 - MEASURING TESTING
Information Patent Grant
Dielectric waveguide device, phase shifter, high frequency switch,...
- Patent number 8,013,694
- Issue date Sep 6, 2011
- Kyocera Corporation
- Nobuki Hiramatsu
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
INFORMATION PROCESSING APPARATUS, INFORMATION PRESENTATION APPARATU...
- Publication number 20180113019
- Publication date Apr 26, 2018
- Kyocera Corporation
- Yasuhiko FUKUOKA
- G01 - MEASURING TESTING
Information Patent Application
ANTENNA, DIPOLE ANTENNA, AND COMMUNICATION APPARATUS USING THE SAME
- Publication number 20130249759
- Publication date Sep 26, 2013
- KYOCERA CORPORATION
- Djuniadi Arifin Sagala
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
High-Frequency Module and Method of Manufacturing the Same, and Tra...
- Publication number 20110025552
- Publication date Feb 3, 2011
- KYOCERA CORPORATION
- Djuniadi A. Sagala
- G01 - MEASURING TESTING
Information Patent Application
High-Frequency Module and Method of Manufacturing the Same, and Tra...
- Publication number 20110025550
- Publication date Feb 3, 2011
- KYOCERA CORPORATION
- Djuniadi A. Sagala
- G01 - MEASURING TESTING
Information Patent Application
Dielectric Waveguide Device, Phase Shifter, High Frequency Switch,...
- Publication number 20090174499
- Publication date Jul 9, 2009
- KYOCERA CORPORATION
- Nobuki Hiramatsu
- G01 - MEASURING TESTING