Dmitry A. Vengertsev

Person

Beacon, NY, US

People

Patents Grantslast 30 patents

Information Patent Grant
Apparatuses and methods for color matching and recommendations
- Patent number 11,995,567
- Issue date May 28, 2024
- Micron Technology, Inc.
- Yi Hu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Transformer neural network in memory
- Patent number 11,983,619
- Issue date May 14, 2024
- Micron Technology, Inc.
- Jing Gong
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Apparatuses and methods for determining wafer defects
- Patent number 11,922,613
- Issue date Mar 5, 2024
- Micron Technology, Inc.
- Yutao Gong
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Machine learning models based on altered data and systems and metho...
- Patent number 11,861,493
- Issue date Jan 2, 2024
- Micron Technology, Inc.
- Dmitry Vengertsev
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Bayesian network in memory
- Patent number 11,681,906
- Issue date Jun 20, 2023
- Micron Technology, Inc.
- Dmitry Vengertsev
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Texture detection apparatuses, systems, and methods for analysis
- Patent number 11,585,654
- Issue date Feb 21, 2023
- Micron Technology, Inc.
- Zahra Hosseinimakarem
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor wafer inspection using care area group-specific thres...
- Patent number 10,146,036
- Issue date Dec 4, 2018
- GLOBALFOUNDRIES Inc.
- Parul Dhagat
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Expansion of allowed design rule space by waiving benign geometries
- Patent number 10,042,973
- Issue date Aug 7, 2018
- GLOBALFOUNDRIES Inc.
- Ioana C. Graur
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Generative learning for realistic and ground rule clean hot spot sy...
- Patent number 9,690,898
- Issue date Jun 27, 2017
- GLOBALFOUNDRIES Inc.
- Ioana C. Graur
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY

Patents Applicationslast 30 patents

Information Patent Application
TRANSFORMER NEURAL NETWORK IN MEMORY
- Publication number 20240289597
- Publication date Aug 29, 2024
- Micron Technology, Inc.
- Jing Gong
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
APPARATUSES AND METHODS FOR COLOR MATCHING AND RECOMMENDATIONS
- Publication number 20240273388
- Publication date Aug 15, 2024
- Micron Technology, Inc.
- Yi Hu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
APPARATUSES AND METHODS FOR DETERMINING WAFER DEFECTS
- Publication number 20240185406
- Publication date Jun 6, 2024
- Micron Technology, Inc.
- Yutao Gong
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
BINARY NEURAL NETWORK IN MEMORY
- Publication number 20220366224
- Publication date Nov 17, 2022
- Micron Technology, Inc.
- Dmitry Vengertsev
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
ANOMALY DETECTION AND RESOLUTION
- Publication number 20220138612
- Publication date May 5, 2022
- Micron Technology, Inc.
- Dmitry Vengertsev
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
APPARATUSES AND METHODS FOR COLOR MATCHING AND RECOMMENDATIONS
- Publication number 20220067544
- Publication date Mar 3, 2022
- Micron Technology, Inc.
- Yi Hu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
BAYESIAN NETWORK IN MEMORY
- Publication number 20220067491
- Publication date Mar 3, 2022
- Micron Technology, Inc.
- Dmitry Vengertsev
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
TRANSFORMER NEURAL NETWORK IN MEMORY
- Publication number 20220051078
- Publication date Feb 17, 2022
- Micron Technology, Inc.
- Jing Gong
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
TEXTURE DETECTION APPARATUSES, SYSTEMS, AND METHODS FOR ANALYSIS
- Publication number 20210372785
- Publication date Dec 2, 2021
- Micron Technology, Inc.
- Zahra Hosseinimakarem
- G01 - MEASURING TESTING
Information Patent Application
MACHINE LEARNING MODELS BASED ON ALTERED DATA AND SYSTEMS AND METHO...
- Publication number 20210201195
- Publication date Jul 1, 2021
- Micron Technology, Inc.
- Dmitry Vengertsev
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
APPARATUSES AND METHODS FOR DETERMINING WAFER DEFECTS
- Publication number 20210201460
- Publication date Jul 1, 2021
- Micron Technology, Inc.
- Yutao Gong
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
EXPANSION OF ALLOWED DESIGN RULE SPACE BY WAIVING BENIGN GEOMETRIES
- Publication number 20180096093
- Publication date Apr 5, 2018
- GLOBALFOUNDRIES INC.
- Ioana C. Graur
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SEMICONDUCTOR WAFER INSPECTION USING CARE AREA GROUP-SPECIFIC THRES...
- Publication number 20170352145
- Publication date Dec 7, 2017
- GLOBALFOUNDRIES INC.
- Parul Dhagat
- G02 - OPTICS
Information Patent Application
GENERATIVE LEARNING FOR REALISTIC AND GROUND RULE CLEAN HOT SPOT SY...
- Publication number 20160378902
- Publication date Dec 29, 2016
- GLOBALFOUNDRIES INC.
- Ioana C. Graur
- G06 - COMPUTING CALCULATING COUNTING

Dmitry A. Vengertsev

Person

Patents Grantslast 30 patents

Apparatuses and methods for color matching and recommendations

Transformer neural network in memory

Apparatuses and methods for determining wafer defects

Machine learning models based on altered data and systems and metho...

Bayesian network in memory

Texture detection apparatuses, systems, and methods for analysis

Semiconductor wafer inspection using care area group-specific thres...

Expansion of allowed design rule space by waiving benign geometries

Generative learning for realistic and ground rule clean hot spot sy...

Patents Applicationslast 30 patents

TRANSFORMER NEURAL NETWORK IN MEMORY

APPARATUSES AND METHODS FOR COLOR MATCHING AND RECOMMENDATIONS

APPARATUSES AND METHODS FOR DETERMINING WAFER DEFECTS

BINARY NEURAL NETWORK IN MEMORY

ANOMALY DETECTION AND RESOLUTION

APPARATUSES AND METHODS FOR COLOR MATCHING AND RECOMMENDATIONS

BAYESIAN NETWORK IN MEMORY

TRANSFORMER NEURAL NETWORK IN MEMORY

TEXTURE DETECTION APPARATUSES, SYSTEMS, AND METHODS FOR ANALYSIS

MACHINE LEARNING MODELS BASED ON ALTERED DATA AND SYSTEMS AND METHO...

APPARATUSES AND METHODS FOR DETERMINING WAFER DEFECTS

EXPANSION OF ALLOWED DESIGN RULE SPACE BY WAIVING BENIGN GEOMETRIES

SEMICONDUCTOR WAFER INSPECTION USING CARE AREA GROUP-SPECIFIC THRES...

GENERATIVE LEARNING FOR REALISTIC AND GROUND RULE CLEAN HOT SPOT SY...