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Dmitry Shur

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  • Holon, IL
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Patents Grantslast 30 patents

Patents Applicationslast 30 patents

  • Information Patent Application

    CHARGED PARTICLE DETECTION SYSTEM
    • Publication number 20210280387
    • Publication date Sep 9, 2021
    • EL-MULTECHNOLOGIES LTD
    • Dmitry SHUR
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    CHARGED PARTICLE DETECTION SYSTEM
    • Publication number 20200312609
    • Publication date Oct 1, 2020
    • EL-MUL TECHNOLOGIES LTD.
    • Dmitry SHUR
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    PARTICLE DETECTION ASSEMBLY, SYSTEM AND METHOD
    • Publication number 20190259571
    • Publication date Aug 22, 2019
    • EL-MUL TECHNOLOGIES LTD.
    • ELI CHEIFETZ
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    System and Method of SEM Overlay Metrology
    • Publication number 20140353498
    • Publication date Dec 4, 2014
    • KLA-Tencor Corporation
    • Dmitry Shur
    • G01 - MEASURING TESTING
  • Information Patent Application

    SYSTEM AND METHOD FOR MATERIAL ANALYSYS OF A MICROSCOPIC ELEMENT
    • Publication number 20110024622
    • Publication date Feb 3, 2011
    • Dmitry Shur
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    CONTACT OPENING METROLOGY
    • Publication number 20070257191
    • Publication date Nov 8, 2007
    • Alexander Kadyshevitch
    • G01 - MEASURING TESTING
  • Information Patent Application

    High current electron beam inspection
    • Publication number 20070057687
    • Publication date Mar 15, 2007
    • Alexander Kadyshevitch
    • G01 - MEASURING TESTING
  • Information Patent Application

    Contact opening metrology
    • Publication number 20060113471
    • Publication date Jun 1, 2006
    • Alexander Kadyshevitch
    • G01 - MEASURING TESTING
  • Information Patent Application

    Contact opening metrology
    • Publication number 20050173657
    • Publication date Aug 11, 2005
    • Applied Materials,Inc
    • Alexander Kadyshevitch
    • G01 - MEASURING TESTING
  • Information Patent Application

    Specimen current mapper
    • Publication number 20040084622
    • Publication date May 6, 2004
    • Applied Materials Israel Ltd.
    • Alexander Kadyshevitch
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    Contact opening metrology
    • Publication number 20040021076
    • Publication date Feb 5, 2004
    • Applied Materials Israel Ltd.
    • Alexander Kadyshevitch
    • G01 - MEASURING TESTING