Dmitry Skvortsov

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Sunnyvale, CA, US

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Patents Grantslast 30 patents

Information Patent Grant
Systems and methods for skewed basis set fitting
- Patent number 11,639,892
- Issue date May 2, 2023
- ABB Schweiz AG
- J. Brian Leen
- G01 - MEASURING TESTING
Information Patent Grant
Systems and method for laser voltage imaging state mapping
- Patent number 9,244,121
- Issue date Jan 26, 2016
- DCG Systems, Inc.
- Yin Shyang Ng
- G01 - MEASURING TESTING
Information Patent Grant
Systems and method for laser voltage imaging state mapping
- Patent number 8,754,633
- Issue date Jun 17, 2014
- DCG Systems, Inc.
- Yin Shyang Ng
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
SYSTEMS AND METHODS FOR SKEWED BASIS SET FITTING
- Publication number 20220317029
- Publication date Oct 6, 2022
- ABB Schweiz AG
- J. Brian Leen
- G01 - MEASURING TESTING
Information Patent Application
SYSTEMS AND METHOD FOR LASER VOLTAGE IMAGING STATE MAPPING
- Publication number 20160139200
- Publication date May 19, 2016
- DCG SYSTEMS, INC.
- Yin Shyang Ng
- G01 - MEASURING TESTING
Information Patent Application
SYSTEMS AND METHOD FOR LASER VOLTAGE IMAGING STATE MAPPING
- Publication number 20140292363
- Publication date Oct 2, 2014
- Yin Shyang Ng
- G01 - MEASURING TESTING
Information Patent Application
SYSTEMS AND METHOD FOR LASER VOLTAGE IMAGING STATE MAPPING
- Publication number 20100277159
- Publication date Nov 4, 2010
- Yin Shyang NG
- G01 - MEASURING TESTING