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DOK WON LEE
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MOUNTAIN VIEW, CA, US
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Patents Grants
last 30 patents
Information
Patent Grant
Multi-site concurrent wafer probe magnetic circuit testing
Patent number
11,927,604
Issue date
Mar 12, 2024
Texas Instruments Incorporated
Xinkun Huang
G01 - MEASURING TESTING
Information
Patent Grant
Semiconductor integrated fluxgate device shielded by discrete magne...
Patent number
11,921,134
Issue date
Mar 5, 2024
Texas Instruments Incorporated
Dok Won Lee
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Magnetic current sensing
Patent number
11,885,834
Issue date
Jan 30, 2024
Texas Instruments Incorporated
Lei Ding
G01 - MEASURING TESTING
Information
Patent Grant
Semiconductor device with passivated magnetic concentrator
Patent number
11,864,471
Issue date
Jan 2, 2024
Texas Instruments Incorporated
Rafael Jose Lizares Guevara
G01 - MEASURING TESTING
Information
Patent Grant
Semiconductor integrated fluxgate device shielded by discrete magne...
Patent number
11,619,658
Issue date
Apr 4, 2023
Texas Instruments Incorporated
Dok Won Lee
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Integrated current sensor with magnetic flux concentrators
Patent number
11,422,167
Issue date
Aug 23, 2022
Texas Instruments Incorporated
Dok Won Lee
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Conductor design for integrated magnetic devices
Patent number
11,393,787
Issue date
Jul 19, 2022
Texas Instruments Incorporated
Dok Won Lee
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Magnetic flux concentrator for in-plane direction magnetic field co...
Patent number
11,237,223
Issue date
Feb 1, 2022
Texas Instruments Incorporated
Jo Bito
G01 - MEASURING TESTING
Information
Patent Grant
Trimmable silicon-based thermistor with reduced stress dependence
Patent number
11,004,929
Issue date
May 11, 2021
Texas Instruments Incorporated
Dok Won Lee
G01 - MEASURING TESTING
Information
Patent Grant
Tilted segmented anisotropic magneto-resistive angular sensor
Patent number
10,782,154
Issue date
Sep 22, 2020
Texas Instruments Incorporated
Byron Jon Roderick Shulver
G01 - MEASURING TESTING
Information
Patent Grant
Magnetostrictive strain gauge sensor
Patent number
10,746,611
Issue date
Aug 18, 2020
Texas Instruments Incorporated
Dok Won Lee
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
High performance fluxgate device
Patent number
10,718,826
Issue date
Jul 21, 2020
Texas Instruments Incorporated
Mona M. Eissa
G01 - MEASURING TESTING
Information
Patent Grant
Highly sensitive, low power fluxgate magnetic sensor integrated ont...
Patent number
10,705,159
Issue date
Jul 7, 2020
Texas Instruments Incorporated
Erika Lynn Mazotti
G01 - MEASURING TESTING
Information
Patent Grant
Hall effect sensors with a metal layer comprising an interconnect a...
Patent number
10,680,164
Issue date
Jun 9, 2020
Texas Instruments Incorporated
Keith Ryan Green
G01 - MEASURING TESTING
Information
Patent Grant
High performance fluxgate device
Patent number
10,663,534
Issue date
May 26, 2020
Texas Instruments Incorporated
Mona M. Eissa
G01 - MEASURING TESTING
Information
Patent Grant
Anisotropic magneto-resistive (AMR) angle sensor die comprising a p...
Patent number
10,627,459
Issue date
Apr 21, 2020
Texas Instruments Incorporated
Dok Won Lee
G01 - MEASURING TESTING
Information
Patent Grant
Integrated circuit with hall effect and anisotropic magnetoresistiv...
Patent number
10,374,004
Issue date
Aug 6, 2019
Texas Instruments Incorporated
Dok Won Lee
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Anisotropic magneto-resistive (AMR) angle sensor
Patent number
10,365,123
Issue date
Jul 30, 2019
Texas Instruments Incorporated
Dok Won Lee
G01 - MEASURING TESTING
Information
Patent Grant
Highly sensitive, low power fluxgate magnetic sensor integrated ont...
Patent number
10,345,397
Issue date
Jul 9, 2019
Texas Instruments Incorporated
Erika Lynn Mazotti
G01 - MEASURING TESTING
Information
Patent Grant
Structure and design of an anisotropic magnetoresistive angular sensor
Patent number
10,302,457
Issue date
May 28, 2019
Texas Instruments Incorporated
William David French
G01 - MEASURING TESTING
Information
Patent Grant
Integrated anisotropic magnetoresistive device
Patent number
10,276,787
Issue date
Apr 30, 2019
Texas Instruments Incorporated
Dok Won Lee
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Integrated circuit with hall effect and anisotropic magnetoresistiv...
Patent number
10,211,255
Issue date
Feb 19, 2019
Texas Instruments Incorporated
Dok Won Lee
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Magnetic core
Patent number
10,199,573
Issue date
Feb 5, 2019
Texas Instruments Incorporated
Mona Eissa
G01 - MEASURING TESTING
Information
Patent Grant
Dual-axis fluxgate device
Patent number
10,184,991
Issue date
Jan 22, 2019
Texas Instruments Incorporated
Dok Won Lee
G01 - MEASURING TESTING
Information
Patent Grant
Reduction of magnetic sensor component variation due to magnetic ma...
Patent number
10,162,016
Issue date
Dec 25, 2018
Texas Instruments Incorporated
Ann Margaret Gabrys
G01 - MEASURING TESTING
Information
Patent Grant
Fluxgate device with low fluxgate noise
Patent number
10,147,537
Issue date
Dec 4, 2018
Texas Instruments Incorporated
Dok Won Lee
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Wiring layout to reduce magnetic field
Patent number
10,067,201
Issue date
Sep 4, 2018
Texas Instruments Incorporated
Iouri N Mirgorodski
H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information
Patent Grant
Magnetic field annealing for integrated fluxgate sensors
Patent number
10,017,851
Issue date
Jul 10, 2018
Texas Instruments Incorporated
Dok Won Lee
C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information
Patent Grant
Integrated circuit with hall effect and anisotropic magnetoresistiv...
Patent number
9,893,119
Issue date
Feb 13, 2018
Texas Instruments Incorporated
Dok Won Lee
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Fluxgate device with low fluxgate noise
Patent number
9,870,858
Issue date
Jan 16, 2018
Texas Instruments Incorporated
Dok Won Lee
H01 - BASIC ELECTRIC ELEMENTS
Patents Applications
last 30 patents
Information
Patent Application
VERTICAL HIGH CURRENT HALL SENSOR WITH INTEGRATED HEAT SLUG CURRENT...
Publication number
20240096767
Publication date
Mar 21, 2024
TEXAS INSTRUMENTS INCORPORATED
Hank Sung
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
SEMICONDUCTOR INTEGRATED FLUXGATE DEVICE SHIELDED BY DISCRETE MAGNE...
Publication number
20230243874
Publication date
Aug 3, 2023
TEXAS INSTRUMENTS INCORPORATED
DOK WON LEE
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
SEMICONDUCTOR DEVICE WITH PASSIVATED MAGNETIC CONCENTRATOR
Publication number
20230135922
Publication date
May 4, 2023
TEXAS INSTRUMENTS INCORPORATED
Rafael Jose Lizares Guevara
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Thin Film Anisotropic Magnetoresistor Device and Formation
Publication number
20230096573
Publication date
Mar 30, 2023
TEXAS INSTRUMENTS INCORPORATED
Fuchao Wang
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
MAGNETIC SENSOR ARRAY PROCESSING FOR INTERFERENCE REDUCTION
Publication number
20230052689
Publication date
Feb 16, 2023
TEXAS INSTRUMENTS INCORPORATED
Lei Ding
H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information
Patent Application
INTEGRATED CURRENT SENSOR WITH MAGNETIC FLUX CONCENTRATORS
Publication number
20220357369
Publication date
Nov 10, 2022
TEXAS INSTRUMENTS INCORPORATED
Dok Won LEE
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
MAGNETIC CURRENT SENSING
Publication number
20220065900
Publication date
Mar 3, 2022
TEXAS INSTRUMENTS INCORPORATED
LEI DING
G01 - MEASURING TESTING
Information
Patent Application
INTEGRATED CURRENT SENSOR WITH MAGNETIC FLUX CONCENTRATORS
Publication number
20220018879
Publication date
Jan 20, 2022
TEXAS INSTRUMENTS INCORPORATED
Dok Won LEE
G01 - MEASURING TESTING
Information
Patent Application
MULTI-SITE CONCURRENT WAFER PROBE MAGNETIC CIRCUIT TESTING
Publication number
20210356497
Publication date
Nov 18, 2021
TEXAS INSTRUMENTS INCORPORATED
Xinkun Huang
G01 - MEASURING TESTING
Information
Patent Application
MAGNETIC FLUX CONCENTRATOR FOR OUT-OF-PLANE DIRECTION MAGNETIC FIEL...
Publication number
20210072327
Publication date
Mar 11, 2021
TEXAS INSTRUMENTS INCORPORATED
Jo BITO
G01 - MEASURING TESTING
Information
Patent Application
MAGNETIC FLUX CONCENTRATOR FOR IN-PLANE DIRECTION MAGNETIC FIELD CO...
Publication number
20210025948
Publication date
Jan 28, 2021
TEXAS INSTRUMENTS INCORPORATED
Jo BITO
B32 - LAYERED PRODUCTS
Information
Patent Application
TUNABLE MULTI-SEGMENT THERMISTOR
Publication number
20200118720
Publication date
Apr 16, 2020
TEXAS INSTRUMENTS INCORPORATED
William David French
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
TRIMMABLE SILICON-BASED THERMISTOR WITH REDUCED STRESS DEPENDENCE
Publication number
20200119132
Publication date
Apr 16, 2020
TEXAS INSTRUMENTS INCORPORATED
Dok Won Lee
G01 - MEASURING TESTING
Information
Patent Application
HIGHLY SENSITIVE, LOW POWER FLUXGATE MAGNETIC SENSOR INTEGRATED ONT...
Publication number
20190324097
Publication date
Oct 24, 2019
TEXAS INSTRUMENTS INCORPORATED
Erika Lynn Mazotti
G01 - MEASURING TESTING
Information
Patent Application
HALL EFFECT SENSORS WITH A METAL LAYER COMPRISING AN INTERCONNECT A...
Publication number
20190267539
Publication date
Aug 29, 2019
TEXAS INSTRUMENTS INCORPORATED
Keith Ryan GREEN
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
MAGNETOSTRICTIVE STRAIN GAUGE SENSOR
Publication number
20190178730
Publication date
Jun 13, 2019
TEXAS INSTRUMENTS INCORPORATED
DOK WON LEE
G01 - MEASURING TESTING
Information
Patent Application
SEMICONDUCTOR INTEGRATED FLUXGATE DEVICE SHIELDED BY DISCRETE MAGNE...
Publication number
20190178915
Publication date
Jun 13, 2019
TEXAS INSTRUMENTS INCORPORATED
DOK WON LEE
G01 - MEASURING TESTING
Information
Patent Application
CONDUCTOR DESIGN FOR INTEGRATED MAGNETIC DEVICES
Publication number
20190164934
Publication date
May 30, 2019
TEXAS INSTRUMENTS INCORPORATED
Dok Won Lee
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
INTEGRATED CIRCUIT WITH HALL EFFECT AND ANISOTROPIC MAGNETORESISTIV...
Publication number
20190157342
Publication date
May 23, 2019
TEXAS INSTRUMENTS INCORPORATED
Dok Won Lee
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
REDUCTION OF MAGNETIC SENSOR COMPONENT VARIATION DUE TO MAGNETIC MA...
Publication number
20190101601
Publication date
Apr 4, 2019
TEXAS INSTRUMENTS INCORPORATED
Ann Margaret Gabrys
G01 - MEASURING TESTING
Information
Patent Application
ANISOTROPIC MAGNETO-RESISTIVE (AMR) ANGLE SENSOR
Publication number
20190025086
Publication date
Jan 24, 2019
TEXAS INSTRUMENTS INCORPORATED
Dok Won LEE
G01 - MEASURING TESTING
Information
Patent Application
ANISOTROPIC MAGNETO-RESISTIVE (AMR) ANGLE SENSOR DIE COMPRISING A P...
Publication number
20190018082
Publication date
Jan 17, 2019
TEXAS INSTRUMENTS INCORPORATED
Dok Won LEE
G01 - MEASURING TESTING
Information
Patent Application
TILTED SEGMENTED ANISOTROPIC MAGNETO-RESISTIVE ANGULAR SENSOR
Publication number
20180372511
Publication date
Dec 27, 2018
TEXAS INSTRUMENTS INCORPORATED
Byron Jon Roderick Shulver
G01 - MEASURING TESTING
Information
Patent Application
STRUCTURE AND DESIGN OF AN ANISOTROPIC MAGNETORESISTIVE ANGULAR SENSOR
Publication number
20180202837
Publication date
Jul 19, 2018
TEXAS INSTRUMENTS INCORPORATED
William David French
G01 - MEASURING TESTING
Information
Patent Application
INTEGRATED CIRCUIT WITH HALL EFFECT AND ANISOTROPIC MAGNETORESISTIV...
Publication number
20180130849
Publication date
May 10, 2018
TEXAS INSTRUMENTS INCORPORATED
Dok Won Lee
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
FLUXGATE DEVICE WITH LOW FLUXGATE NOISE
Publication number
20180096784
Publication date
Apr 5, 2018
TEXAS INSTRUMENTS INCORPORATED
Dok Won Lee
G01 - MEASURING TESTING
Information
Patent Application
HIGHLY SENSITIVE, LOW POWER FLUXGATE MAGNETIC SENSOR INTEGRATED ONT...
Publication number
20170343622
Publication date
Nov 30, 2017
TEXAS INSTRUMENTS INCORPORATED
Erika Lynn Mazotti
G01 - MEASURING TESTING
Information
Patent Application
MAGNETIC CORE
Publication number
20170346000
Publication date
Nov 30, 2017
TEXAS INSTRUMENTS INCORPORATED
Mona Eissa
G01 - MEASURING TESTING
Information
Patent Application
Dual-Axis Fluxgate Device
Publication number
20170328961
Publication date
Nov 16, 2017
TEXAS INSTRUMENTS INCORPORATED
Dok Won Lee
G01 - MEASURING TESTING
Information
Patent Application
FLUXGATE DEVICE WITH LOW FLUXGATE NOISE
Publication number
20170316875
Publication date
Nov 2, 2017
TEXAS INSTRUMENTS INCORPORATED
Dok Won Lee
G01 - MEASURING TESTING