Dominic David

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Campbell, CA, US

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Patents Grantslast 30 patents

Information Patent Grant
Computer-implemented methods and systems for classifying defects on...
- Patent number 8,532,949
- Issue date Sep 10, 2013
- KLA-Tencor Technologies Corp.
- Cho Huak Teh
- G01 - MEASURING TESTING
Information Patent Grant
Reuse in semiconductor measurement recipes
- Patent number 7,047,101
- Issue date May 16, 2006
- KLA-Tencor Technologies Corporation
- Scott Young
- Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...

Patents Applicationslast 30 patents

Information Patent Application
Computer-implemented methods and systems for classifying defects on...
- Publication number 20060082763
- Publication date Apr 20, 2006
- Cho Huak Teh
- G06 - COMPUTING CALCULATING COUNTING