Dominique L. DEMERS

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Waterloo, CA

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Patents Grantslast 30 patents

Information Patent Grant
Measurements of an integrated circuit chip and connected chip carri...
- Patent number 10,969,222
- Issue date Apr 6, 2021
- International Business Machines Corporation
- Elaine Cyr
- G01 - MEASURING TESTING
Information Patent Grant
Measurements of an integrated circuit chip and connected chip carri...
- Patent number 9,897,444
- Issue date Feb 20, 2018
- International Business Machines Corporation
- Elaine Cyr
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
MEASUREMENTS OF AN INTEGRATED CIRCUIT CHIP AND CONNECTED CHIP CARRI...
- Publication number 20180080765
- Publication date Mar 22, 2018
- International Business Machines Corporation
- Elaine CYR
- G01 - MEASURING TESTING
Information Patent Application
MEASUREMENTS OF AN INTEGRATED CIRCUIT CHIP AND CONNECTED CHIP CARRI...
- Publication number 20160178363
- Publication date Jun 23, 2016
- International Business Machines Corporation
- Elaine CYR
- G01 - MEASURING TESTING