Dominique Yon

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Saint Aubin Sur Mer, FR

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Patents Grantslast 30 patents

Information Patent Grant
Embedded structure for passivation integrity testing
- Patent number 8,519,388
- Issue date Aug 27, 2013
- NXP B.V.
- Lucie A. Rousseville
- G01 - MEASURING TESTING
Information Patent Grant
Electronic device and method for making the same
- Patent number 7,786,014
- Issue date Aug 31, 2010
- IPDIA
- Francois Neuilly
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
METHOD OF MANUFACTURING AN INTERPOSER PRODUCT
- Publication number 20230290649
- Publication date Sep 14, 2023
- Murata Manufacturing Co., Ltd.
- Sophie GABORIEAU
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
EMBEDDED STRUCTURE FOR PASSIVATION INTEGRITY TESTING
- Publication number 20110140104
- Publication date Jun 16, 2011
- NXP B.V.
- Lucie A. Rousseville
- G01 - MEASURING TESTING
Information Patent Application
ELECTRONIC DEVICE AND METHOD FOR MAKING THE SAME
- Publication number 20090269931
- Publication date Oct 29, 2009
- NXP, B.V.
- Francois Neuilly
- H01 - BASIC ELECTRIC ELEMENTS