Don LIN

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Taipei City, TW

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Patents Grantslast 30 patents

Information Patent Grant
Apparatus and method for three-dimensional inspection
- Patent number 10,841,561
- Issue date Nov 17, 2020
- Test Research, Inc.
- Wen-Tzong Lee
- G01 - MEASURING TESTING
Information Patent Grant
Three-dimensional measurement system
- Patent number 9,423,246
- Issue date Aug 23, 2016
- Test Research, Inc.
- Liang-Pin Yu
- G01 - MEASURING TESTING
Information Patent Grant
Measuring system for a 3D object
- Patent number 9,420,235
- Issue date Aug 16, 2016
- Test Research, Inc.
- Kuang-Pu Wen
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Three-dimensional image measuring apparatus
- Patent number 9,019,351
- Issue date Apr 28, 2015
- Test Research Inc.
- Liang-Pin Yu
- H04 - ELECTRIC COMMUNICATION TECHNIQUE

Patents Applicationslast 30 patents

Information Patent Application
APPARATUS AND METHOD FOR THREE-DIMENSIONAL INSPECTION
- Publication number 20180278911
- Publication date Sep 27, 2018
- Test Research, Inc.
- Wen-Tzong LEE
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
THREE-DIMENSIONAL IMAGE MEASURING APPARATUS
- Publication number 20140022357
- Publication date Jan 23, 2014
- Test Research, Inc.
- Liang-Pin YU
- G01 - MEASURING TESTING
Information Patent Application
THREE-DIMENSIONAL MEASUREMENT SYSTEM AND THREE-DIMENSIONAL MEASUREM...
- Publication number 20130278723
- Publication date Oct 24, 2013
- Test Research, Inc.
- Liang-Pin YU
- G01 - MEASURING TESTING
Information Patent Application
Measuring system for a 3D Object
- Publication number 20110228082
- Publication date Sep 22, 2011
- Kuang-Pu Wen
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
Optical-enhanced apparatus and method for illuminating printed circ...
- Publication number 20040150714
- Publication date Aug 5, 2004
- Test Research, Inc.
- Don Lin
- G01 - MEASURING TESTING