Don McClimans

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Fairport, NY, US

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Patents Grantslast 30 patents

Information Patent Grant
Method of assembling a composite data map having a closed-form solu...
- Patent number 7,593,599
- Issue date Sep 22, 2009
- Corning Incorporated
- Simon Lee
- G01 - MEASURING TESTING
Information Patent Grant
Phase-resolved measurement for frequency-shifting interferometry
- Patent number 7,268,889
- Issue date Sep 11, 2007
- Corning Incorporated
- Andrew Kulawiec
- G01 - MEASURING TESTING
Information Patent Grant
System for locating and measuring an index mark on an edge of a wafer
- Patent number 6,342,705
- Issue date Jan 29, 2002
- Chapman Instruments
- Kenneth J. Li
- G01 - MEASURING TESTING
Information Patent Grant
Automated optical surface profile measurement system
- Patent number 6,157,450
- Issue date Dec 5, 2000
- Chapman Instruments
- Silvio P. Marchese-Ragona
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
A Method of Assembling a Composite Data Map Having a Closed-Form So...
- Publication number 20070003163
- Publication date Jan 4, 2007
- Corning Incorporated
- Simon Lee
- G01 - MEASURING TESTING
Information Patent Application
Phase-resolved measurement for frequency-shifting interferometry
- Publication number 20060061772
- Publication date Mar 23, 2006
- Andrew Kulawiec
- G01 - MEASURING TESTING