Donald A. Landis

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Pinole, CA, US

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Patents Grantslast 30 patents

Information Patent Grant
Broadband high resolution X-ray spectral analyzer
- Patent number 5,777,336
- Issue date Jul 7, 1998
- The Regents of the University of California
- Eric H. Silver
- G01 - MEASURING TESTING
Information Patent Grant
High resolution, high rate X-ray spectrometer
- Patent number 4,658,216
- Issue date Apr 14, 1987
- The United States of America as represented by the Department of Energy
- Frederick S. Goulding
- G01 - MEASURING TESTING