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Donald A. Rogowski
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Plano, TX, US
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last 30 patents
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Patent Grant
Reduced stress electrode for focal plane array of thermal imaging s...
Patent number
5,847,390
Issue date
Dec 8, 1998
Texas Instruments Incorporated
John P. Long
G01 - MEASURING TESTING
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Patent Grant
Reduced stress focal plane array for thermal imaging system and method
Patent number
5,757,000
Issue date
May 26, 1998
Texas Instruments Incorporated
Donald A. Rogowski
G01 - MEASURING TESTING