TREA

Donald Allan Hale

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  • San Jose, CA, US
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Patents Grantslast 30 patents

  • Information Patent Grant

    Banded ECP sensor
    • Patent number 6,411,667
    • Issue date Jun 25, 2002
    • General Electric Company
    • Young Jin Kim
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Banded ECP sensor
    • Patent number 6,370,213
    • Issue date Apr 9, 2002
    • General Electric Company
    • Young Jin Kim
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Platinum tip ECP sensor and fabrication thereof
    • Patent number 6,222,307
    • Issue date Apr 24, 2001
    • General Electric Company
    • Prodyot Roy
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Shroud electrochemical potential monitor
    • Patent number 5,465,278
    • Issue date Nov 7, 1995
    • General Electric Company
    • Robert L. Cowan
    • G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING

Patents Applicationslast 30 patents

  • Information Patent Application

    Banded ECP sensor
    • Publication number 20020015463
    • Publication date Feb 7, 2002
    • Young Jin Kim
    • G01 - MEASURING TESTING