Donald B. T. Kilgus

Person

Brighton, MI, US

People

Patents Grantslast 30 patents

Information Patent Grant
Optical scanning method and system and method for correcting optica...
- Patent number 7,466,466
- Issue date Dec 16, 2008
- GSI Group Corporation
- Jonathan S. Ehrmann
- G02 - OPTICS
Information Patent Grant
Method and system for high speed measuring of microscopic targets
- Patent number 7,199,882
- Issue date Apr 3, 2007
- GSI Group Corporation
- Donald J. Svetkoff
- G01 - MEASURING TESTING
Information Patent Grant
Method and system for 3D imaging of target regions
- Patent number 6,750,974
- Issue date Jun 15, 2004
- GSI Lumonics Corporation
- Donald J. Svetkoff
- G01 - MEASURING TESTING
Information Patent Grant
Method and system for high speed measuring of microscopic targets
- Patent number 6,452,686
- Issue date Sep 17, 2002
- General Scanning, Inc.
- Donald J. Svetkoff
- G02 - OPTICS
Information Patent Grant
Method and system for high speed measuring of microscopic targets
- Patent number 6,366,357
- Issue date Apr 2, 2002
- General Scanning, Inc.
- Donald J. Svetkoff
- G02 - OPTICS
Information Patent Grant
Method and system for high speed measuring of microscopic targets
- Patent number 6,249,347
- Issue date Jun 19, 2001
- General Scanning, Inc.
- Donald J. Svetkoff
- G02 - OPTICS
Information Patent Grant
Method and system for high speed measuring of microscopic targets
- Patent number 6,181,425
- Issue date Jan 30, 2001
- General Scanning, Inc.
- Donald J. Svetkoff
- G02 - OPTICS
Information Patent Grant
Method and system for high speed measuring of microscopic targets
- Patent number 6,177,998
- Issue date Jan 23, 2001
- General Scanning, Inc.
- Donald J. Svetkoff
- G02 - OPTICS
Information Patent Grant
Versatile method and system for high speed, 3D imaging of microscop...
- Patent number 6,098,031
- Issue date Aug 1, 2000
- GSI Lumonics, Inc.
- Donald J. Svetkoff
- G02 - OPTICS
Information Patent Grant
Method and system for suppressing unwanted reflections in an optica...
- Patent number 6,028,671
- Issue date Feb 22, 2000
- General Scanning, Inc.
- Donald J. Svetkoff
- G01 - MEASURING TESTING
Information Patent Grant
Scanned remote imaging method and system and method of determining...
- Patent number 5,822,486
- Issue date Oct 13, 1998
- General Scanning, Inc.
- Donald J. Svetkoff
- G02 - OPTICS
Information Patent Grant
Scanned remote imaging method and system and method of determining...
- Patent number 5,768,461
- Issue date Jun 16, 1998
- General Scanning, Inc.
- Donald J. Svetkoff
- G02 - OPTICS

Patents Applicationslast 30 patents

Information Patent Application
Optical scanning method and system and method for correcting optica...
- Publication number 20060256181
- Publication date Nov 16, 2006
- Jonathan S. Ehrmann
- G02 - OPTICS
Information Patent Application
Method and system for high speed measuring of microscopic targets
- Publication number 20050174580
- Publication date Aug 11, 2005
- GSI Lumonics Corporation
- Donald J. Svetkoff
- G02 - OPTICS
Information Patent Application
Method and system for high speed measuring of microscopic targets
- Publication number 20040179207
- Publication date Sep 16, 2004
- GSI Lumonics Corporation
- Donald J. Svetkoff
- G02 - OPTICS
Information Patent Application
Method and system for high speed measuring of microscopic targets
- Publication number 20030184764
- Publication date Oct 2, 2003
- General Scanning, Inc.
- Donald J. Svetkoff
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND SYSTEM FOR HIGH SPEED MEASURING OF MICROSCOPIC TARGETS
- Publication number 20020105655
- Publication date Aug 8, 2002
- General Scanning, Inc.
- Donald J. Svetkoff
- G01 - MEASURING TESTING

Donald B. T. Kilgus

Person

Patents Grantslast 30 patents

Optical scanning method and system and method for correcting optica...

Method and system for high speed measuring of microscopic targets

Method and system for 3D imaging of target regions

Method and system for high speed measuring of microscopic targets

Method and system for high speed measuring of microscopic targets

Method and system for high speed measuring of microscopic targets

Method and system for high speed measuring of microscopic targets

Method and system for high speed measuring of microscopic targets

Versatile method and system for high speed, 3D imaging of microscop...

Method and system for suppressing unwanted reflections in an optica...

Scanned remote imaging method and system and method of determining...

Scanned remote imaging method and system and method of determining...

Patents Applicationslast 30 patents

Optical scanning method and system and method for correcting optica...

Method and system for high speed measuring of microscopic targets

Method and system for high speed measuring of microscopic targets

Method and system for high speed measuring of microscopic targets

METHOD AND SYSTEM FOR HIGH SPEED MEASURING OF MICROSCOPIC TARGETS