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Donald Cheng
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Hsinchu, TW
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last 30 patents
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Patent Grant
Method of testing electromigration lifetime
Patent number
6,350,626
Issue date
Feb 26, 2002
United Microelectronics Corp.
Donald Cheng
G01 - MEASURING TESTING
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Patent Grant
Reliability testing method of dielectric thin film
Patent number
6,269,315
Issue date
Jul 31, 2001
United Microelectronics Corp.
Kuan-Yu Fu
G01 - MEASURING TESTING