Donald E. Edenfeld

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Beaverton, OR, US

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Patents Grantslast 30 patents

Information Patent Grant
Probe head and electronic device testing system
- Patent number 11,112,430
- Issue date Sep 7, 2021
- Intel Corporation
- Anil Kaza
- G01 - MEASURING TESTING
Information Patent Grant
Probes for wafer sorting
- Patent number 10,578,647
- Issue date Mar 3, 2020
- Intel Corporation
- Todd Albertson
- B21 - MECHANICAL METAL-WORKING WITHOUT ESSENTIALLY REMOVING MATERIAL PUNCHING...
Information Patent Grant
High speed VLSI digital tester architecture for real-time output ti...
- Patent number 6,768,297
- Issue date Jul 27, 2004
- Intel Corporation
- John C. Johnson
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
PROBE HEAD AND ELECTRONIC DEVICE TESTING SYSTEM
- Publication number 20200309818
- Publication date Oct 1, 2020
- Anil Kaza
- G01 - MEASURING TESTING
Information Patent Application
PROBES FOR WAFER SORTING
- Publication number 20190101569
- Publication date Apr 4, 2019
- Intel Corporation
- Todd Albertson
- G01 - MEASURING TESTING
Information Patent Application
High speed VLSI digital tester architecture for real-time output ti...
- Publication number 20020063556
- Publication date May 30, 2002
- Intel Corporation
- John C. Johnson
- G01 - MEASURING TESTING