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Donald E. Osten
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Bolingbrook, IL, US
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last 30 patents
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Patent Grant
Scintillation counting system for in-situ measurement of radioactiv...
Patent number
5,198,670
Issue date
Mar 30, 1993
Packard Instrument Company
Gustaaf C. VanCauter
G01 - MEASURING TESTING
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Patent Grant
Method and apparatus for performing high sensitivity fluorescence m...
Patent number
5,018,866
Issue date
May 28, 1991
Packard Instrument Company
Donald E. Osten
G01 - MEASURING TESTING