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Donald E. Vandenberg
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Brockport, NY, US
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Patents Grants
last 30 patents
Information
Patent Grant
Focus detecting system using a beam splitter to form an image at no...
Patent number
5,552,594
Issue date
Sep 3, 1996
Eastman Kodak Company
Donald E. Vandenberg
G02 - OPTICS
Information
Patent Grant
Foucault method for testing an optical surface
Patent number
5,155,544
Issue date
Oct 13, 1992
Eastman Kodak Company
Donald E. Vandenberg
G01 - MEASURING TESTING
Information
Patent Grant
Application of the Foucault knife-edge test to a segmented optic
Patent number
5,020,905
Issue date
Jun 4, 1991
Eastman Kodak Company
Thomas W. Dey
G01 - MEASURING TESTING
Information
Patent Grant
Method for correction of distortions of an imaging device
Patent number
4,993,823
Issue date
Feb 19, 1991
Eastman Kodak Company
William E. Schaffer
G02 - OPTICS
Information
Patent Grant
Closed loop Foucault knife-edge test
Patent number
4,993,831
Issue date
Feb 19, 1991
Eastman Kodak Company
Donald E. Vandenberg
G01 - MEASURING TESTING
Information
Patent Grant
Foucault knife-edge test for quantitatively determining a wavefront...
Patent number
4,979,819
Issue date
Dec 25, 1990
Eastman Kodak Company
William D. Humbel
G01 - MEASURING TESTING
Information
Patent Grant
Expanded foucault knife-edge test for quantitatively testing an opt...
Patent number
4,969,737
Issue date
Nov 13, 1990
Eastman Kodak Company
William D. Humbel
G01 - MEASURING TESTING
Information
Patent Grant
Method and system for wavefront reconstruction
Patent number
4,933,872
Issue date
Jun 12, 1990
Eastman Kodak Company
Donald E. Vandenberg
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Method for correction of distortions of a mirror
Patent number
4,875,765
Issue date
Oct 24, 1989
Eastman Kodak Company
Donald E. Vandenberg
G02 - OPTICS
Information
Patent Grant
Assembly for correction of distortions of a mirror
Patent number
4,875,764
Issue date
Oct 24, 1989
Eastman Kodak Company
Philip F. Marino
G02 - OPTICS