Donald Farrell

Person

Raleigh, NC, US

People

Patents Grantslast 30 patents

Information Patent Grant
Systems and processes for increasing semiconductor device reliability
- Patent number 11,784,155
- Issue date Oct 10, 2023
- Wolfspeed, Inc.
- Sung Chul Joo
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Systems and processes for increasing semiconductor device reliability
- Patent number 11,289,441
- Issue date Mar 29, 2022
- Wolfspeed, Inc.
- Sung Chul Joo
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
High power MMIC devices having bypassed gate transistors
- Patent number 9,947,616
- Issue date Apr 17, 2018
- Cree, Inc.
- Simon M. Wood
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Transistor with bypassed gate structure field
- Patent number 9,786,660
- Issue date Oct 10, 2017
- Cree, Inc.
- Donald Farrell
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
RF transistor packages with internal stability network and methods...
- Patent number 8,330,265
- Issue date Dec 11, 2012
- Cree, Inc.
- Donald Farrell
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Receive frequency band interference protection system using predist...
- Patent number 8,102,940
- Issue date Jan 24, 2012
- Lockheed Martin Corporation
- Allen Katz
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
RF power transistor packages with internal harmonic frequency reduc...
- Patent number 8,076,994
- Issue date Dec 13, 2011
- Cree, Inc.
- Donald Farrell
- H03 - BASIC ELECTRONIC CIRCUITRY

Patents Applicationslast 30 patents

Information Patent Application
TRANSISTOR DIE INCLUDING MATCHING CIRCUIT
- Publication number 20240072732
- Publication date Feb 29, 2024
- Wolfspeed, Inc.
- Donald Farrell
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
IPD COMPONENTS HAVING SIC SUBSTRATES AND DEVICES AND PROCESSES IMPL...
- Publication number 20230197587
- Publication date Jun 22, 2023
- Wolfspeed, Inc.
- Donald FARRELL
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SYSTEMS AND PROCESSES FOR INCREASING SEMICONDUCTOR DEVICE RELIABILITY
- Publication number 20220216175
- Publication date Jul 7, 2022
- Wolfspeed, Inc.
- Sung Chul JOO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Systems and Processes for Increasing Semiconductor Device Reliability
- Publication number 20210111144
- Publication date Apr 15, 2021
- Cree, Inc.
- Sung Chul Joo
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
HIGH POWER MMIC DEVICES HAVING BYPASSED GATE TRANSISTORS
- Publication number 20170271258
- Publication date Sep 21, 2017
- Cree, Inc.
- Simon M. Wood
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Transistor with Bypassed Gate Structure Field
- Publication number 20170271329
- Publication date Sep 21, 2017
- Cree, Inc.
- Donald Farrell
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
RF TRANSISTOR PACKAGES WITH INTERNAL STABILITY NETWORK AND METHODS...
- Publication number 20080315393
- Publication date Dec 25, 2008
- Cree, Inc.
- Donald Farrell
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
RF POWER TRANSISTOR PACKAGES WITH INTERNAL HARMONIC FREQUENCY REDUC...
- Publication number 20080315392
- Publication date Dec 25, 2008
- Cree, Inc.
- Donald Farrell
- H03 - BASIC ELECTRONIC CIRCUITRY

Donald Farrell

Person

Patents Grantslast 30 patents

Systems and processes for increasing semiconductor device reliability

Systems and processes for increasing semiconductor device reliability

High power MMIC devices having bypassed gate transistors

Transistor with bypassed gate structure field

RF transistor packages with internal stability network and methods...

Receive frequency band interference protection system using predist...

RF power transistor packages with internal harmonic frequency reduc...

Patents Applicationslast 30 patents

TRANSISTOR DIE INCLUDING MATCHING CIRCUIT

IPD COMPONENTS HAVING SIC SUBSTRATES AND DEVICES AND PROCESSES IMPL...

SYSTEMS AND PROCESSES FOR INCREASING SEMICONDUCTOR DEVICE RELIABILITY

Systems and Processes for Increasing Semiconductor Device Reliability

HIGH POWER MMIC DEVICES HAVING BYPASSED GATE TRANSISTORS

Transistor with Bypassed Gate Structure Field

RF TRANSISTOR PACKAGES WITH INTERNAL STABILITY NETWORK AND METHODS...

RF POWER TRANSISTOR PACKAGES WITH INTERNAL HARMONIC FREQUENCY REDUC...