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Donald Ginesi
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Lakeland, FL, US
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Patents Grants
last 30 patents
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Patent Grant
Wafer and method
Patent number
6,973,833
Issue date
Dec 13, 2005
Caldon, Inc.
Donald Ginesi
G01 - MEASURING TESTING
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last 30 patents
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Patent Application
Wafer and method
Publication number
20030172737
Publication date
Sep 18, 2003
Caldon, Inc.
Donald Ginesi
G01 - MEASURING TESTING