Donald Ginesi

Person

  • Lakeland, FL, US

Patents Grantslast 30 patents

  • Information Patent Grant

    Wafer and method

    • Patent number 6,973,833
    • Issue date Dec 13, 2005
    • Caldon, Inc.
    • Donald Ginesi
    • G01 - MEASURING TESTING

Patents Applicationslast 30 patents

  • Information Patent Application

    Wafer and method

    • Publication number 20030172737
    • Publication date Sep 18, 2003
    • Caldon, Inc.
    • Donald Ginesi
    • G01 - MEASURING TESTING