Donald K. Cohen

Follow

Person

Farmington Hills, MI, US

People

Patents Grantslast 30 patents

Information Patent Grant
Method and apparatus for measuring, analyzing, and characterizing i...
- Patent number 7,013,716
- Issue date Mar 21, 2006
- Dana Corporation
- Mark Shuster
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for measuring irregularities on an outer surfa...
- Patent number 6,816,250
- Issue date Nov 9, 2004
- Dana Corporation
- Mark Shuster
- G01 - MEASURING TESTING
Information Patent Grant
Non-destructive inspection method for an impact treated surface
- Patent number 6,415,044
- Issue date Jul 2, 2002
- Advanced Material Processing
- Roger S. Simpson
- G01 - MEASURING TESTING