Donald K. Mitchell

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Wayland, MA, US

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Patents Grantslast 30 patents

Information Patent Grant
Scale assembly for optical encoder having affixed optical reference...
- Patent number 7,343,693
- Issue date Mar 18, 2008
- GSI Group Corporation
- Donald K. Mitchell
- G01 - MEASURING TESTING
Information Patent Grant
Optical encoder having slanted optical detector elements for harmon...
- Patent number 7,324,212
- Issue date Jan 29, 2008
- GSI Group Corporation
- Donald K. Mitchell
- G01 - MEASURING TESTING
Information Patent Grant
Multi-track optical encoder employing beam divider
- Patent number 7,193,204
- Issue date Mar 20, 2007
- GSI Group Corporation
- Donald K. Mitchell
- G01 - MEASURING TESTING
Information Patent Grant
Optical position encoder having alignment indicators providing quan...
- Patent number 7,067,797
- Issue date Jun 27, 2006
- GSI Group Corporation
- Donald K. Mitchell
- G01 - MEASURING TESTING
Information Patent Grant
Position encoder with scale calibration
- Patent number 6,686,585
- Issue date Feb 3, 2004
- Microe Systems Corporation
- Donald L. Grimes
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Optical encoder having slanted optical detector elements for harmon...
- Publication number 20070153292
- Publication date Jul 5, 2007
- GSI Group Corporation
- Donald K. Mitchell
- G01 - MEASURING TESTING
Information Patent Application
Scale assembly for optical encoder having affixed optical reference...
- Publication number 20070144026
- Publication date Jun 28, 2007
- GSI Group Corporation
- Donald K. Mitchell
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL ENCODER HAVING SLANTED OPTICAL DETECTOR ELEMENTS FOR HARMON...
- Publication number 20070024865
- Publication date Feb 1, 2007
- Donald K. Mitchell
- G01 - MEASURING TESTING
Information Patent Application
Multi-track optical encoder employing beam divider
- Publication number 20040007664
- Publication date Jan 15, 2004
- MICROE SYSTEMS, INC.
- Donald K. Mitchell
- G01 - MEASURING TESTING
Information Patent Application
Position encoder with scale calibration
- Publication number 20030052260
- Publication date Mar 20, 2003
- MicroE Systems Corporation
- Donald L. Grimes
- G01 - MEASURING TESTING