Donald L. Wheater

Person

Hinesburg, VT, US

People

Patents Grantslast 30 patents

Information Patent Grant
Test structure and methodology for three-dimensional semiconductor...
- Patent number 8,729,549
- Issue date May 20, 2014
- International Business Machines Corporation
- Kerry Bernstein
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Microcontroller for logic built-in self test (LBIST)
- Patent number 8,423,847
- Issue date Apr 16, 2013
- International Business Machines Corporation
- Gary D. Grise
- G01 - MEASURING TESTING
Information Patent Grant
Test structure and methodology for three-dimensional semiconductor...
- Patent number 8,294,149
- Issue date Oct 23, 2012
- International Business Machines Corporation
- Kerry Bernstein
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Microcontroller for logic built-in self test (LBIST)
- Patent number 8,205,124
- Issue date Jun 19, 2012
- International Business Machines Corporation
- Gary D. Grise
- G01 - MEASURING TESTING
Information Patent Grant
Diagnostic method and apparatus for non-destructively observing lat...
- Patent number 7,916,826
- Issue date Mar 29, 2011
- International Business Machines Corporation
- Darren L. Anand
- G11 - INFORMATION STORAGE
Information Patent Grant
Structure for system for and method of performing high speed memory...
- Patent number 7,870,454
- Issue date Jan 11, 2011
- International Business Machines Corporation
- Kevin W. Gorman
- G11 - INFORMATION STORAGE
Information Patent Grant
System and method for performing high speed memory diagnostics via...
- Patent number 7,607,060
- Issue date Oct 20, 2009
- International Business Machines Corporation
- Kevin W. Gorman
- G11 - INFORMATION STORAGE
Information Patent Grant
Microcontroller for logic built-in self test (LBIST)
- Patent number 7,490,280
- Issue date Feb 10, 2009
- International Business Machines Corporation
- Gary D. Grise
- G01 - MEASURING TESTING
Information Patent Grant
Diagnostic method and apparatus for non-destructively observing lat...
- Patent number 7,453,973
- Issue date Nov 18, 2008
- International Business Machines Corporation
- Darren L. Anand
- G11 - INFORMATION STORAGE
Information Patent Grant
Arrangement for testing semiconductor chips while incorporated on a...
- Patent number 7,435,990
- Issue date Oct 14, 2008
- International Business Machines Corporation
- Brion L. Keller
- G01 - MEASURING TESTING
Information Patent Grant
Arrangement for testing semiconductor chips while incorporated on a...
- Patent number 7,381,986
- Issue date Jun 3, 2008
- International Business Machines Corporation
- Brion L. Keller
- G01 - MEASURING TESTING
Information Patent Grant
Method for testing embedded DRAM arrays
- Patent number 7,237,165
- Issue date Jun 26, 2007
- International Business Machines Corporation
- Laura S. Chadwick
- G11 - INFORMATION STORAGE
Information Patent Grant
Diagnostic method and apparatus for non-destructively observing lat...
- Patent number 7,145,977
- Issue date Dec 5, 2006
- International Business Machines Corporation
- Darren L Anand
- G11 - INFORMATION STORAGE
Information Patent Grant
Method and system for reducing test data volume in the testing of l...
- Patent number 7,103,816
- Issue date Sep 5, 2006
- Cadence Design Systems, Inc.
- Frank O. Distler
- G01 - MEASURING TESTING
Information Patent Grant
Testing logic and embedded memory in parallel
- Patent number 7,103,814
- Issue date Sep 5, 2006
- International Business Machines Corporation
- William R. Corbin
- G11 - INFORMATION STORAGE
Information Patent Grant
Method for testing embedded DRAM arrays
- Patent number 7,073,100
- Issue date Jul 4, 2006
- International Business Machines Corporation
- Laura S. Chadwick
- G11 - INFORMATION STORAGE
Information Patent Grant
Method and apparatus for reduced pin count package connection verif...
- Patent number 6,931,346
- Issue date Aug 16, 2005
- International Business Machines Corporation
- Michael L. Combs
- G01 - MEASURING TESTING
Information Patent Grant
Method for testing integrated logic circuits
- Patent number 6,804,803
- Issue date Oct 12, 2004
- International Business Machines Corporation
- Carl F. Barnhart
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method of electrically blowing fuses under control of an on-chip te...
- Patent number 6,768,694
- Issue date Jul 27, 2004
- International Business Machines Corporation
- Darren L. Anand
- G11 - INFORMATION STORAGE
Information Patent Grant
System and method to predetermine a bitmap of a self-tested embedde...
- Patent number 6,754,864
- Issue date Jun 22, 2004
- International Business Machines Corporation
- David V. Gangl
- G11 - INFORMATION STORAGE
Information Patent Grant
Method for chip testing
- Patent number 6,730,529
- Issue date May 4, 2004
- International Business Machines Corporation
- Howard L. Kalter
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for reduced pin count package connection verif...
- Patent number 6,724,210
- Issue date Apr 20, 2004
- International Business Machines Corporation
- Michael L. Combs
- G01 - MEASURING TESTING
Information Patent Grant
Deterministic random LBIST
- Patent number 6,708,305
- Issue date Mar 16, 2004
- International Business Machines Corporation
- L. Owen Farnsworth
- G01 - MEASURING TESTING
Information Patent Grant
Method for test optimization using historical and actual fabricatio...
- Patent number 6,618,682
- Issue date Sep 9, 2003
- International Business Machines Corporation
- Raymond J. Bulaga
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Integrated test structure and method for verification of microelect...
- Patent number 6,549,150
- Issue date Apr 15, 2003
- International Business Machines Corporation
- Raymond J. Bulaga
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Structures for wafer level test and burn-in
- Patent number 6,426,904
- Issue date Jul 30, 2002
- International Business Machines Corporation
- John E. Barth
- G01 - MEASURING TESTING
Information Patent Grant
Single pin performance screen ring oscillator with frequency division
- Patent number 6,426,641
- Issue date Jul 30, 2002
- International Business Machines Corporation
- Steven P. Koch
- G01 - MEASURING TESTING
Information Patent Grant
Built-in self-test for analog to digital converter
- Patent number 6,333,706
- Issue date Dec 25, 2001
- International Business Machines Corporation
- Brooks A. Cummings
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Structures for wafer level test and burn-in
- Patent number 6,233,184
- Issue date May 15, 2001
- International Business Machines Corporation
- John E. Barth
- G01 - MEASURING TESTING
Information Patent Grant
Built in self test method and structure for analog to digital conve...
- Patent number 6,229,465
- Issue date May 8, 2001
- International Business Machines Corporation
- Raymond J. Bulaga
- H03 - BASIC ELECTRONIC CIRCUITRY

Patents Applicationslast 30 patents

Information Patent Application
TEST STRUCTURE AND METHODOLOGY FOR THREE-DIMENSIONAL SEMICONDUCTOR...
- Publication number 20120262197
- Publication date Oct 18, 2012
- International Business Machines Corporation
- Kerry Bernstein
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
TEST STRUCTURE AND METHODOLOGY FOR THREE-DIMENSIONAL SEMICONDUCTOR...
- Publication number 20120264241
- Publication date Oct 18, 2012
- International Business Machines Corporation
- Kerry Bernstein
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MICROCONTROLLER FOR LOGIC BUILT-IN SELF TEST (LBIST)
- Publication number 20120221910
- Publication date Aug 30, 2012
- International Business Machines Corporation
- Gary D. Grise
- G01 - MEASURING TESTING
Information Patent Application
DIAGNOSTIC METHOD AND APPARATUS FOR NON-DESTRUCTIVELY OBSERVING LAT...
- Publication number 20090180584
- Publication date Jul 16, 2009
- International Business Machines Corporation
- Darren L. Anand
- G11 - INFORMATION STORAGE
Information Patent Application
TEST STRUCTURE AND METHODOLOGY FOR THREE-DIMENSIONAL SEMICONDUCTOR...
- Publication number 20090114913
- Publication date May 7, 2009
- International Business Machines Corporation
- Kerry Bernstein
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MICROCONTROLLER FOR LOGIC BUILT-IN SELF TEST (LBIST)
- Publication number 20090055696
- Publication date Feb 26, 2009
- International Business Machines Corporation
- Gary D. Grise
- G01 - MEASURING TESTING
Information Patent Application
Structure for System for and Method of Performing High Speed Memory...
- Publication number 20080222464
- Publication date Sep 11, 2008
- International Business Machines Corporation
- Kevin W. Gorman
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM FOR AND METHOD OF PERFORMING HIGH SPEED MEMORY DIAGNOSTICS V...
- Publication number 20080082883
- Publication date Apr 3, 2008
- Kevin W Gorman
- G11 - INFORMATION STORAGE
Information Patent Application
MICROCONTROLLER FOR LOGIC BUILT-IN SELF TEST (LBIST)
- Publication number 20070204193
- Publication date Aug 30, 2007
- Gary D. Grise
- G01 - MEASURING TESTING
Information Patent Application
Diagnostic Method and Apparatus For Non-Destructively Observing Lat...
- Publication number 20070033458
- Publication date Feb 8, 2007
- Darren L. Anand
- G11 - INFORMATION STORAGE
Information Patent Application
Arrangement for testing semiconductor chips while incorporated on a...
- Publication number 20060284174
- Publication date Dec 21, 2006
- Brion L. Keller
- G01 - MEASURING TESTING
Information Patent Application
Method for testing embedded DRAM arrays
- Publication number 20050088888
- Publication date Apr 28, 2005
- Laura S. Chadwick
- G11 - INFORMATION STORAGE
Information Patent Application
DIAGNOSTIC METHOD AND APPARATUS FOR NON-DESTRUCTIVELY OBSERVING LAT...
- Publication number 20050025277
- Publication date Feb 3, 2005
- International Business Machines Corporation
- Darren L. Anand
- G11 - INFORMATION STORAGE
Information Patent Application
Method and apparatus for reduced pin count package connection verif...
- Publication number 20040153276
- Publication date Aug 5, 2004
- Michael L. Combs
- G01 - MEASURING TESTING
Information Patent Application
AN ARRANGEMENT FOR TESTING SEMICONDUCTOR CHIPS WHILE INCORPORATED O...
- Publication number 20040135231
- Publication date Jul 15, 2004
- International Business Machines Corporation
- Brion L. Keller
- G01 - MEASURING TESTING
Information Patent Application
Method for testing embedded DRAM arrays
- Publication number 20040093539
- Publication date May 13, 2004
- International Business Machines Corporation
- Laura S. Chadwick
- G11 - INFORMATION STORAGE
Information Patent Application
Testing logic and embedded memory in parallel
- Publication number 20040083412
- Publication date Apr 29, 2004
- International Business Machines Corporation
- William R. Corbin
- G01 - MEASURING TESTING
Information Patent Application
METHOD OF ELECTRICALLY BLOWING FUSES UNDER CONTROL OF AN ON-CHIP TE...
- Publication number 20040066695
- Publication date Apr 8, 2004
- International Business Machines Corporation
- Darren L. Anand
- G11 - INFORMATION STORAGE
Information Patent Application
INTEGRATED TEST STRUCTURE AND METHOD FOR VERIFICATION OF MICROELECT...
- Publication number 20030063019
- Publication date Apr 3, 2003
- Raymond J. Bulaga
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
Method and apparatus for reduced pin count package connection verif...
- Publication number 20030038650
- Publication date Feb 27, 2003
- Michael L. Combs
- G01 - MEASURING TESTING
Information Patent Application
Method for test optimization using historical and actual fabricatio...
- Publication number 20020155628
- Publication date Oct 24, 2002
- International Business Machines Corporation
- Raymond J. Bulaga
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method for testing integrated logic circuits
- Publication number 20020147559
- Publication date Oct 10, 2002
- Carl F. Barnhart
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
System and method to predetermine a bitmap of a self-tested embedde...
- Publication number 20020116676
- Publication date Aug 22, 2002
- International Business Machines Corporation
- David V. Gangl
- G11 - INFORMATION STORAGE
Information Patent Application
Method and system for reducing test data volume in the testing of l...
- Publication number 20020099991
- Publication date Jul 25, 2002
- International Business Machines Corporation
- Frank O. Distler
- G01 - MEASURING TESTING
Information Patent Application
Structures for wafer level test and burn -in
- Publication number 20010046168
- Publication date Nov 29, 2001
- John E. Barth
- G01 - MEASURING TESTING

Donald L. Wheater

Person

Patents Grantslast 30 patents

Test structure and methodology for three-dimensional semiconductor...

Microcontroller for logic built-in self test (LBIST)

Test structure and methodology for three-dimensional semiconductor...

Microcontroller for logic built-in self test (LBIST)

Diagnostic method and apparatus for non-destructively observing lat...

Structure for system for and method of performing high speed memory...

System and method for performing high speed memory diagnostics via...

Microcontroller for logic built-in self test (LBIST)

Diagnostic method and apparatus for non-destructively observing lat...

Arrangement for testing semiconductor chips while incorporated on a...

Arrangement for testing semiconductor chips while incorporated on a...

Method for testing embedded DRAM arrays

Diagnostic method and apparatus for non-destructively observing lat...

Method and system for reducing test data volume in the testing of l...

Testing logic and embedded memory in parallel

Method for testing embedded DRAM arrays

Method and apparatus for reduced pin count package connection verif...

Method for testing integrated logic circuits

Method of electrically blowing fuses under control of an on-chip te...

System and method to predetermine a bitmap of a self-tested embedde...

Method for chip testing

Method and apparatus for reduced pin count package connection verif...

Deterministic random LBIST

Method for test optimization using historical and actual fabricatio...

Integrated test structure and method for verification of microelect...

Structures for wafer level test and burn-in

Single pin performance screen ring oscillator with frequency division

Built-in self-test for analog to digital converter

Structures for wafer level test and burn-in

Built in self test method and structure for analog to digital conve...

Patents Applicationslast 30 patents

TEST STRUCTURE AND METHODOLOGY FOR THREE-DIMENSIONAL SEMICONDUCTOR...

TEST STRUCTURE AND METHODOLOGY FOR THREE-DIMENSIONAL SEMICONDUCTOR...

MICROCONTROLLER FOR LOGIC BUILT-IN SELF TEST (LBIST)

DIAGNOSTIC METHOD AND APPARATUS FOR NON-DESTRUCTIVELY OBSERVING LAT...

TEST STRUCTURE AND METHODOLOGY FOR THREE-DIMENSIONAL SEMICONDUCTOR...

MICROCONTROLLER FOR LOGIC BUILT-IN SELF TEST (LBIST)

Structure for System for and Method of Performing High Speed Memory...

SYSTEM FOR AND METHOD OF PERFORMING HIGH SPEED MEMORY DIAGNOSTICS V...

MICROCONTROLLER FOR LOGIC BUILT-IN SELF TEST (LBIST)

Diagnostic Method and Apparatus For Non-Destructively Observing Lat...

Arrangement for testing semiconductor chips while incorporated on a...

Method for testing embedded DRAM arrays

DIAGNOSTIC METHOD AND APPARATUS FOR NON-DESTRUCTIVELY OBSERVING LAT...

Method and apparatus for reduced pin count package connection verif...

AN ARRANGEMENT FOR TESTING SEMICONDUCTOR CHIPS WHILE INCORPORATED O...

Method for testing embedded DRAM arrays

Testing logic and embedded memory in parallel

METHOD OF ELECTRICALLY BLOWING FUSES UNDER CONTROL OF AN ON-CHIP TE...

INTEGRATED TEST STRUCTURE AND METHOD FOR VERIFICATION OF MICROELECT...

Method and apparatus for reduced pin count package connection verif...

Method for test optimization using historical and actual fabricatio...

Method for testing integrated logic circuits

System and method to predetermine a bitmap of a self-tested embedde...

Method and system for reducing test data volume in the testing of l...

Structures for wafer level test and burn -in