Donald P. Richmond, II

Person

Palo Alto, CA, US

People

Patents Grantslast 30 patents

Information Patent Grant
System for testing an integrated circuit of a device and its method...
- Patent number 8,228,085
- Issue date Jul 24, 2012
- AEHR Test Systems
- Scott E. Lindsey
- G01 - MEASURING TESTING
Information Patent Grant
Electronics tester with a signal distribution board and a wafer chu...
- Patent number 8,198,909
- Issue date Jun 12, 2012
- AEHR Test Systems
- Steven C. Steps
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus for testing electronic devices
- Patent number 8,118,618
- Issue date Feb 21, 2012
- AEHR Test Systems
- Donald P. Richmond, II
- G01 - MEASURING TESTING
Information Patent Grant
Separate test electronics and blower modules in an apparatus for te...
- Patent number 7,969,175
- Issue date Jun 28, 2011
- AEHR Test Systems
- David S. Hendrickson
- G01 - MEASURING TESTING
Information Patent Grant
Wafer level burn-in and electrical test system and method
- Patent number 7,928,754
- Issue date Apr 19, 2011
- AEHR Test Systems
- Donald Paul Richmond, II
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Electronics tester with a signal distribution board and a wafer chu...
- Patent number 7,902,846
- Issue date Mar 8, 2011
- AEHR Test Systems
- Steven C. Steps
- G01 - MEASURING TESTING
Information Patent Grant
System for testing an integrated circuit of a device and its method...
- Patent number 7,800,382
- Issue date Sep 21, 2010
- AEHR Test Ststems
- Scott E. Lindsey
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus for testing electronic devices
- Patent number 7,762,822
- Issue date Jul 27, 2010
- AEHR Test Systems
- Donald P. Richmond, II
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Electronics tester with a signal distribution board and a wafer chu...
- Patent number 7,667,475
- Issue date Feb 23, 2010
- AEHR Test Systems
- Steven C. Steps
- G01 - MEASURING TESTING
Information Patent Grant
Wafer level burn-in and electrical test system and method
- Patent number 7,619,428
- Issue date Nov 17, 2009
- AEHR Test Systems
- Donald Paul Richmond, II
- G01 - MEASURING TESTING
Information Patent Grant
Wafer burn-in and text employing detachable cartridge
- Patent number 7,541,822
- Issue date Jun 2, 2009
- AEHR Test Systems
- Frank Otto Uher
- G01 - MEASURING TESTING
Information Patent Grant
Assembly for electrically connecting a test component to a testing...
- Patent number 7,511,521
- Issue date Mar 31, 2009
- AEHR Test Systems
- Donald P. Richmond, II
- G01 - MEASURING TESTING
Information Patent Grant
Assembly for electrically connecting a test component to a testing...
- Patent number 7,385,407
- Issue date Jun 10, 2008
- AEHR Test Systems
- Donald P. Richmond, II
- G01 - MEASURING TESTING
Information Patent Grant
Contactor assembly for testing electrical circuits
- Patent number 7,301,358
- Issue date Nov 27, 2007
- AEHR Test Systems
- Jovan Jovanovic
- G01 - MEASURING TESTING
Information Patent Grant
Wafer burn-in and test employing detachable cartridge
- Patent number 7,088,117
- Issue date Aug 8, 2006
- Aehr Test System
- Frank Otto Uher
- G01 - MEASURING TESTING
Information Patent Grant
Assembly for electrically connecting a test component to a testing...
- Patent number 7,046,022
- Issue date May 16, 2006
- AEHR Test Systems
- Donald P. Richmond, II
- G01 - MEASURING TESTING
Information Patent Grant
Assembly for electrically connecting a test component to a testing...
- Patent number 6,867,608
- Issue date Mar 15, 2005
- AEHR Test Systems
- Donald P. Richmond, II
- G01 - MEASURING TESTING
Information Patent Grant
Contactor assembly for testing electrical circuits
- Patent number 6,853,209
- Issue date Feb 8, 2005
- AEHR Test Systems
- Jovan Jovanovic
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
SYSTEM FOR TESTING AN INTEGRATED CIRCUIT OF A DEVICE AND ITS METHOD...
- Publication number 20120280704
- Publication date Nov 8, 2012
- Aehr Test Systems
- Scott E. Lindsey
- G01 - MEASURING TESTING
Information Patent Application
Adhesively Attached Stand-Offs On A Portable Pack For An Electronic...
- Publication number 20120223729
- Publication date Sep 6, 2012
- Aehr Test Systems
- Steven C. Steps
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS FOR TESTING ELECTRONIC DEVICES
- Publication number 20120113556
- Publication date May 10, 2012
- Aehr Test Systems
- Donald P. Richmond, II
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SEPARATE TEST ELECTRONICS AND BLOWER MODULES IN AN APPARATUS FOR TE...
- Publication number 20110256774
- Publication date Oct 20, 2011
- Aehr Test Systems
- David S. Hendrickson
- G01 - MEASURING TESTING
Information Patent Application
ELECTRONICS TESTER WITH A SIGNAL DISTRIBUTION BOARD AND A WAFER CHU...
- Publication number 20110156745
- Publication date Jun 30, 2011
- Aehr Test Systems
- Steven C. Steps
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM FOR TESTING AN INTEGRATED CIRCUIT OF A DEVICE AND ITS METHOD...
- Publication number 20110006800
- Publication date Jan 13, 2011
- Aehr Test Systems
- Scott E. Lindsey
- G01 - MEASURING TESTING
Information Patent Application
SEPARATE TEST ELECTRONICS AND BLOWER MODULES IN AN APPARATUS FOR TE...
- Publication number 20100283475
- Publication date Nov 11, 2010
- Aehr Test Systems
- David S. Hendrickson
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS FOR TESTING ELECTRONIC DEVICES
- Publication number 20100213957
- Publication date Aug 26, 2010
- Aehr Test Systems
- Donald P. Richmond, II
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Wafer Level Burn-In and Electrical Test System and Method
- Publication number 20100176836
- Publication date Jul 15, 2010
- Donald Paul Richmond, II
- G01 - MEASURING TESTING
Information Patent Application
ELECTRONICS TESTER WITH A SIGNAL DISTRIBUTION BOARD AND A WAFER CHU...
- Publication number 20100109696
- Publication date May 6, 2010
- Aehr Test Systems
- Steven C. Steps
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM FOR TESTING AN INTEGRATED CIRCUIT OF A DEVICE AND ITS METHOD...
- Publication number 20090160468
- Publication date Jun 25, 2009
- Aehr Test Systems
- Scott E. Lindsey
- G01 - MEASURING TESTING
Information Patent Application
ELECTRONICS TESTER WITH A SIGNAL DISTRIBUTION BOARD AND A WAFER CHU...
- Publication number 20090015282
- Publication date Jan 15, 2009
- Aehr Test Systems
- Steven C. Steps
- G01 - MEASURING TESTING

Donald P. Richmond, II

Person

Patents Grantslast 30 patents

System for testing an integrated circuit of a device and its method...

Electronics tester with a signal distribution board and a wafer chu...

Apparatus for testing electronic devices

Separate test electronics and blower modules in an apparatus for te...

Wafer level burn-in and electrical test system and method

Electronics tester with a signal distribution board and a wafer chu...

System for testing an integrated circuit of a device and its method...

Apparatus for testing electronic devices

Electronics tester with a signal distribution board and a wafer chu...

Wafer level burn-in and electrical test system and method

Wafer burn-in and text employing detachable cartridge

Assembly for electrically connecting a test component to a testing...

Assembly for electrically connecting a test component to a testing...

Contactor assembly for testing electrical circuits

Wafer burn-in and test employing detachable cartridge

Assembly for electrically connecting a test component to a testing...

Assembly for electrically connecting a test component to a testing...

Contactor assembly for testing electrical circuits

Patents Applicationslast 30 patents

SYSTEM FOR TESTING AN INTEGRATED CIRCUIT OF A DEVICE AND ITS METHOD...

Adhesively Attached Stand-Offs On A Portable Pack For An Electronic...

APPARATUS FOR TESTING ELECTRONIC DEVICES

SEPARATE TEST ELECTRONICS AND BLOWER MODULES IN AN APPARATUS FOR TE...

ELECTRONICS TESTER WITH A SIGNAL DISTRIBUTION BOARD AND A WAFER CHU...

SYSTEM FOR TESTING AN INTEGRATED CIRCUIT OF A DEVICE AND ITS METHOD...

SEPARATE TEST ELECTRONICS AND BLOWER MODULES IN AN APPARATUS FOR TE...

APPARATUS FOR TESTING ELECTRONIC DEVICES

Wafer Level Burn-In and Electrical Test System and Method

ELECTRONICS TESTER WITH A SIGNAL DISTRIBUTION BOARD AND A WAFER CHU...

SYSTEM FOR TESTING AN INTEGRATED CIRCUIT OF A DEVICE AND ITS METHOD...

ELECTRONICS TESTER WITH A SIGNAL DISTRIBUTION BOARD AND A WAFER CHU...