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Donald R. Demers
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Nashua, NH, US
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last 30 patents
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Patent Grant
Spectrometer
Patent number
4,591,267
Issue date
May 27, 1986
Baird Corporation
Donald R. Demers
G01 - MEASURING TESTING
Information
Patent Grant
Spectrometer
Patent number
4,575,241
Issue date
Mar 11, 1986
Baird Corporation
Donald R. Demers
G01 - MEASURING TESTING
Information
Patent Grant
Spectrometer
Patent number
4,432,644
Issue date
Feb 21, 1984
Baird Corporation
Donald R. Demers
G01 - MEASURING TESTING
Information
Patent Grant
Inductively coupled plasma atomic fluorescence spectrometer
Patent number
4,300,834
Issue date
Nov 17, 1981
Baird Corporation
Donald R. Demers
G01 - MEASURING TESTING
Information
Patent Grant
Method for determining the inorganic and metallo-organic salt conte...
Patent number
4,115,063
Issue date
Sep 19, 1978
Baird-Atomic, Inc.
Donald R. Demers
G01 - MEASURING TESTING