Donald S. GIBSON

Person

West Henrietta, NY, US

People

Patents Grantslast 30 patents

Information Patent Grant
Apparatus and method for measurement of multilayer structures
- Patent number 11,215,444
- Issue date Jan 4, 2022
- Lumentrics, Inc.
- Michael A. Marcus
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for measurement of multilayer structures
- Patent number 10,761,021
- Issue date Sep 1, 2020
- Lumetrics, Inc
- Michael A. Marcus
- G01 - MEASURING TESTING
Information Patent Grant
Method of measurement of multilayer structures
- Patent number 10,190,977
- Issue date Jan 29, 2019
- Lumetrics, Inc
- Michael A. Marcus
- G02 - OPTICS
Information Patent Grant
Associated interferometers using multi-fiber optic delay lines
- Patent number 10,006,754
- Issue date Jun 26, 2018
- Lumetrics, Inc
- Donald S. Gibson
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for evaluation of optical elements
- Patent number 9,958,355
- Issue date May 1, 2018
- Lumetrics, Inc
- Filipp V. Ignatovich
- G01 - MEASURING TESTING
Information Patent Grant
Associated interferometers using multi-fiber optic delay lines
- Patent number 9,448,058
- Issue date Sep 20, 2016
- Lumetrics, Inc
- Donald S. Gibson
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for evaluation of optical elements
- Patent number 9,341,541
- Issue date May 17, 2016
- Lumetrics, Inc
- Filipp V. Ignatovich
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for evaluation of optical elements
- Patent number 9,019,485
- Issue date Apr 28, 2015
- Lumetrics, Inc
- Filipp V. Ignatovich
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
APPARATUS AND METHOD FOR MEASUREMENT OF MULTILAYER STRUCTURES
- Publication number 20200393240
- Publication date Dec 17, 2020
- LUMETRICS, INC.
- Michael A. MARCUS
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS AND METHOD FOR MEASUREMENT OF MULTILAYER STRUCTURES
- Publication number 20190162660
- Publication date May 30, 2019
- LUMETRICS, INC.
- Michael A. MARCUS
- G01 - MEASURING TESTING
Information Patent Application
METHOD OF MEASUREMENT OF MULTILAYER STRUCTURES
- Publication number 20180321145
- Publication date Nov 8, 2018
- LUMETRICS, INC.
- Michael A. MARCUS
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ASSOCIATED INTERFEROMETERS USING MULTI-FIBER OPTIC DELAY LINES
- Publication number 20170102222
- Publication date Apr 13, 2017
- LUMETRICS, INC.
- Donald S. GIBSON
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS AND METHOD FOR EVALUATION OF OPTICAL ELEMENTS
- Publication number 20160252425
- Publication date Sep 1, 2016
- LUMETRICS, INC.
- Filipp V. IGNATOVICH
- G01 - MEASURING TESTING
Information Patent Application
ASSOCIATED INTERFEROMETERS USING MULTI-FIBER OPTIC DELAY LINES
- Publication number 20160123716
- Publication date May 5, 2016
- LUMETRICS, INC.
- Donald S. GIBSON
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS AND METHOD FOR EVALUATION OF OPTICAL ELEMENTS
- Publication number 20150204756
- Publication date Jul 23, 2015
- LUMETRICS, INC.
- Filipp V. IGNATOVICH
- G01 - MEASURING TESTING
Information Patent Application
PORTABLE FUNDUS CAMERA
- Publication number 20140267668
- Publication date Sep 18, 2014
- Filipp V. IGNATOVICH
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Application
APPARATUS AND METHOD FOR EVALUATION OF OPTICAL ELEMENTS
- Publication number 20140253907
- Publication date Sep 11, 2014
- LUMETRICS, INC.
- Filipp V. IGNATOVICH
- G01 - MEASURING TESTING

Donald S. GIBSON

Person

Patents Grantslast 30 patents

Apparatus and method for measurement of multilayer structures

Apparatus and method for measurement of multilayer structures

Method of measurement of multilayer structures

Associated interferometers using multi-fiber optic delay lines

Apparatus and method for evaluation of optical elements

Associated interferometers using multi-fiber optic delay lines

Apparatus and method for evaluation of optical elements

Apparatus and method for evaluation of optical elements

Patents Applicationslast 30 patents

APPARATUS AND METHOD FOR MEASUREMENT OF MULTILAYER STRUCTURES

APPARATUS AND METHOD FOR MEASUREMENT OF MULTILAYER STRUCTURES

METHOD OF MEASUREMENT OF MULTILAYER STRUCTURES

ASSOCIATED INTERFEROMETERS USING MULTI-FIBER OPTIC DELAY LINES

APPARATUS AND METHOD FOR EVALUATION OF OPTICAL ELEMENTS

ASSOCIATED INTERFEROMETERS USING MULTI-FIBER OPTIC DELAY LINES

APPARATUS AND METHOD FOR EVALUATION OF OPTICAL ELEMENTS

PORTABLE FUNDUS CAMERA

APPARATUS AND METHOD FOR EVALUATION OF OPTICAL ELEMENTS