Donald W. Chiu

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Santa Clara, CA, US

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Patents Grantslast 30 patents

Information Patent Grant
Test electronics to device under test interfaces, and methods and a...
- Patent number 8,354,853
- Issue date Jan 15, 2013
- Advantest (Singapore) Pte Ltd
- Sanjeev Grover
- G01 - MEASURING TESTING
Information Patent Grant
Zero insertion force printed circuit assembly connector system and...
- Patent number 7,147,499
- Issue date Dec 12, 2006
- Verigy IPco
- Romi Mayder
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
TEST ELECTRONICS TO DEVICE UNDER TEST INTERFACES, AND METHODS AND A...
- Publication number 20130135002
- Publication date May 30, 2013
- ADVANTEST (SINGAPORE) PTE LTD
- Sanjeev Grover
- G01 - MEASURING TESTING
Information Patent Application
TEST ELECTRONICS TO DEVICE UNDER TEST INTERFACES, AND METHODS AND A...
- Publication number 20100134134
- Publication date Jun 3, 2010
- Verigy (Singapore) Pte. Ltd.
- Sanjeev Grover
- G01 - MEASURING TESTING
Information Patent Application
Apparatus for, and method of, positioning an interface unit of an a...
- Publication number 20070213847
- Publication date Sep 13, 2007
- William T. Sprague
- G01 - MEASURING TESTING