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Donald W. Sackett
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Bedford, MA, US
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Patents Grants
last 30 patents
Information
Patent Grant
Portable, hand held aluminum alloy XRF analyzer and method
Patent number
11,169,100
Issue date
Nov 9, 2021
SciAps, Inc.
Donald W. Sackett
G01 - MEASURING TESTING
Information
Patent Grant
Combined handheld XRF and OES systems and methods
Patent number
10,012,603
Issue date
Jul 3, 2018
SciAps, Inc.
Donald W. Sackett
G01 - MEASURING TESTING
Information
Patent Grant
Dual source analyzer with single detector
Patent number
9,970,876
Issue date
May 15, 2018
SciAps, Inc.
Donald W. Sackett
G01 - MEASURING TESTING
Information
Patent Grant
LiBS analyzer sample presence detection system and method
Patent number
9,970,815
Issue date
May 15, 2018
SciAps, Inc.
David R. Day
G01 - MEASURING TESTING
Information
Patent Grant
LIBS analyzer sample presence detection system and method
Patent number
9,664,565
Issue date
May 30, 2017
SciAps, Inc.
David R. Day
G01 - MEASURING TESTING
Information
Patent Grant
LIBS analyzer sample presence detection system and method
Patent number
9,651,424
Issue date
May 16, 2017
SciAps, Inc.
David R. Day
G01 - MEASURING TESTING
Information
Patent Grant
Dual source system and method
Patent number
9,285,272
Issue date
Mar 15, 2016
SciAps, Inc.
Don Sackett
G01 - MEASURING TESTING
Information
Patent Grant
X-ray analysis apparatus with radiation monitoring feature
Patent number
8,787,523
Issue date
Jul 22, 2014
Olympus NDT, Inc.
Don Sackett
G01 - MEASURING TESTING
Information
Patent Grant
XRF analyzer
Patent number
7,430,274
Issue date
Sep 30, 2008
Innov-X Systems, Inc.
Brendan Connors
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
PORTABLE, HAND HELD ALUMINUM ALLOY XRF ANALYZER AND METHOD
Publication number
20190302040
Publication date
Oct 3, 2019
SCIAPS, INC
Donald W. Sackett
G01 - MEASURING TESTING
Information
Patent Application
LiBS Analyzer Sample Presence Detection System and Method
Publication number
20170219429
Publication date
Aug 3, 2017
SCIAPS, INC
David R. Day
G01 - MEASURING TESTING
Information
Patent Application
LIBS ANALYZER SAMPLE PRESENCE DETECTION SYSTEM AND METHOD
Publication number
20160252398
Publication date
Sep 1, 2016
SciAps, Inc.
David R. Day
G01 - MEASURING TESTING
Information
Patent Application
LIBS ANALYZER SAMPLE PRESENCE DETECTION SYSTEM AND METHOD
Publication number
20160252397
Publication date
Sep 1, 2016
SCIAPS, INC
David R. Day
G01 - MEASURING TESTING
Information
Patent Application
COMBINED HANDHELD XRF AND OES SYSTEMS AND METHODS
Publication number
20150377805
Publication date
Dec 31, 2015
SciAps, Inc.
Donald W. Sackett
G01 - MEASURING TESTING
Information
Patent Application
Dual Source Analyzer with Single Detector
Publication number
20140022532
Publication date
Jan 23, 2014
Donald W. Sackett
G01 - MEASURING TESTING
Information
Patent Application
Dual source system and method
Publication number
20140022531
Publication date
Jan 23, 2014
Don Sackett
G01 - MEASURING TESTING
Information
Patent Application
X-ray analysis apparatus with radiation monitoring feature
Publication number
20130003923
Publication date
Jan 3, 2013
Don Sackett
G01 - MEASURING TESTING
Information
Patent Application
XRF analyzer
Publication number
20080205592
Publication date
Aug 28, 2008
Brendan Connors
G01 - MEASURING TESTING