Dong-Chul IHM

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Suwon-si, KR

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Patents Grantslast 30 patents

Information Patent Grant
Method of predicting shape of semiconductor device
- Patent number 11,341,305
- Issue date May 24, 2022
- Samsung Electronics Co., Ltd.
- Kwang-Hoon Kim
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method for detecting defect of substrate
- Patent number 8,890,069
- Issue date Nov 18, 2014
- Samsung Electronics Co., Ltd.
- Jong-Cheon Sun
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
METHOD OF PREDICTING SHAPE OF SEMICONDUCTOR DEVICE
- Publication number 20200201952
- Publication date Jun 25, 2020
- Samsung Electronics Co., Ltd.
- KWANG-HOON KIM
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD FOR DETECTING DEFECT OF SUBSTRATE
- Publication number 20140306109
- Publication date Oct 16, 2014
- Samsung Electronics Co., Ltd.
- Jong-Cheon SUN
- G01 - MEASURING TESTING
Information Patent Application
APPARATUSES AND METHODS FOR EXTRACTING DEFECT DEPTH INFORMATION AND...
- Publication number 20140307052
- Publication date Oct 16, 2014
- Samsung Electronics Co., Ltd.
- Jeong-ho Ahn
- G02 - OPTICS
Information Patent Application
APPARATUS AND METHOD FOR ESTIMATING DEPTH OF BURIED DEFECT IN SUBST...
- Publication number 20140268170
- Publication date Sep 18, 2014
- Samsung Electronics Co., Ltd.
- Jong-Cheon Sun
- G01 - MEASURING TESTING