Dong Kang

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Shanghai, CN

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Patents Grantslast 30 patents

Information Patent Grant
Automatic identification of systematic repeating defects in semicon...
- Patent number 8,312,395
- Issue date Nov 13, 2012
- Semiconductor Manufacturing International (Shanghai) Corporation
- Paul Kuang Chi Lin
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
AUTOMATIC IDENTIFICATION OF SYSTEMATIC REPEATING DEFECTS IN SEMICON...
- Publication number 20120023464
- Publication date Jan 26, 2012
- Semiconductor Manufacturing International (Shanghai) Corporation
- Paul Kuang Chi Lin
- G01 - MEASURING TESTING