Dong Xiang

Person

Beijing, CN

People

Patents Grantslast 30 patents

Information Patent Grant
Scan tree construction
- Patent number 12,092,691
- Issue date Sep 17, 2024
- Tsinghua University
- Can Xiang
- G01 - MEASURING TESTING
Information Patent Grant
Automated warehousing system, display panel production line and log...
- Patent number 11,215,978
- Issue date Jan 4, 2022
- BOE Technology Group Co., Ltd.
- Xiang Dong
- G05 - CONTROLLING REGULATING
Information Patent Grant
Software defined LFSR for LOC delay testing low-power test compression
- Patent number 11,156,662
- Issue date Oct 26, 2021
- Tsinghua University
- Dong Xiang
- G01 - MEASURING TESTING
Information Patent Grant
Low-power test compression for launch-on-capture transition fault t...
- Patent number 10,747,926
- Issue date Aug 18, 2020
- Tsinghua University
- Dong Xiang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method for scan testing three-dimensional chip
- Patent number 9,103,878
- Issue date Aug 11, 2015
- Tsinghua University
- Dong Xiang
- G01 - MEASURING TESTING
Information Patent Grant
Scan-based self-test structure and method using weighted scan-enabl...
- Patent number 7,526,696
- Issue date Apr 28, 2009
- Tsinghua University
- Dong Xiang
- G01 - MEASURING TESTING
Information Patent Grant
Method for reducing pin overhead in non-scan design for testability
- Patent number 7,051,302
- Issue date May 23, 2006
- Tsinghua University
- Dong Xiang
- G01 - MEASURING TESTING
Information Patent Grant
Cost-effective scan architecture and a test application scheme for...
- Patent number 6,959,426
- Issue date Oct 25, 2005
- Tsinghua University
- Dong Xiang
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
Scan Tree Construction
- Publication number 20240151771
- Publication date May 9, 2024
- TSINGHUA UNIVERSITY
- Can Xiang
- G01 - MEASURING TESTING
Information Patent Application
AUTOMATED WAREHOUSING SYSTEM, DISPLAY PANEL PRODUCTION LINE AND LOG...
- Publication number 20210208577
- Publication date Jul 8, 2021
- BOE TECHNOLOGY GROUP CO., LTD.
- Xiang DONG
- G05 - CONTROLLING REGULATING
Information Patent Application
SOFTWARE DEFINED LFSR FOR LOC DELAY TESTING LOW-POWER TEST COMPRESSION
- Publication number 20190339328
- Publication date Nov 7, 2019
- TSINGHUA UNIVERSITY
- Dong XIANG
- G01 - MEASURING TESTING
Information Patent Application
LOW-POWER TEST COMPRESSION FOR LAUNCH-ON-CAPTURE TRANSITION FAULT T...
- Publication number 20190018910
- Publication date Jan 17, 2019
- TSINGHUA UNIVERSITY
- Dong XIANG
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD FOR SCAN TESTING THREE-DIMENSIONAL CHIP
- Publication number 20150074478
- Publication date Mar 12, 2015
- TSINGHUA UNIVERSITY
- Dong Xiang
- G01 - MEASURING TESTING
Information Patent Application
Scan-based self-test structure and method using weighted scan-enabl...
- Publication number 20060236182
- Publication date Oct 19, 2006
- TSINGHUA UNIVERSITY
- Dong Xiang
- G01 - MEASURING TESTING
Information Patent Application
Cost-effective scan architecture and a test application scheme for...
- Publication number 20040153978
- Publication date Aug 5, 2004
- Dong Xiang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Method for reducing pin overhead in non-scan design for testability
- Publication number 20040130313
- Publication date Jul 8, 2004
- Dong Xiang
- G01 - MEASURING TESTING

Person

Patents Grantslast 30 patents

Scan tree construction

Automated warehousing system, display panel production line and log...

Software defined LFSR for LOC delay testing low-power test compression

Low-power test compression for launch-on-capture transition fault t...

Method for scan testing three-dimensional chip

Scan-based self-test structure and method using weighted scan-enabl...

Method for reducing pin overhead in non-scan design for testability

Cost-effective scan architecture and a test application scheme for...

Patents Applicationslast 30 patents

Scan Tree Construction

AUTOMATED WAREHOUSING SYSTEM, DISPLAY PANEL PRODUCTION LINE AND LOG...

SOFTWARE DEFINED LFSR FOR LOC DELAY TESTING LOW-POWER TEST COMPRESSION

LOW-POWER TEST COMPRESSION FOR LAUNCH-ON-CAPTURE TRANSITION FAULT T...

METHOD FOR SCAN TESTING THREE-DIMENSIONAL CHIP

Scan-based self-test structure and method using weighted scan-enabl...

Cost-effective scan architecture and a test application scheme for...

Method for reducing pin overhead in non-scan design for testability