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Dongbing Wang
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Hatoyama, JP
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Patents Grants
last 30 patents
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Patent Grant
Ion trap mass spectrometry and apparatus
Patent number
6,566,651
Issue date
May 20, 2003
Hitachi, Ltd.
Takashi Baba
G01 - MEASURING TESTING
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Patent Grant
Ion trap mass spectrometry and apparatus
Patent number
6,489,609
Issue date
Dec 3, 2002
Hitachi, Ltd.
Takashi Baba
G01 - MEASURING TESTING
Patents Applications
last 30 patents
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Patent Application
Ion trap mass spectrometry and apparatus
Publication number
20030052264
Publication date
Mar 20, 2003
Takashi Baba
G01 - MEASURING TESTING