Dongcheng WU

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Shanghai, CN

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Patents Grantslast 30 patents

Information Patent Grant
Dual-port static random access memory cell layout structure
- Patent number 11,133,322
- Issue date Sep 28, 2021
- Shanghai Huali Integrated Circuit Corporation
- Dongcheng Wu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Testing method for reading current of static random access memory
- Patent number 10,650,909
- Issue date May 12, 2020
- Pinhan Chen
- G11 - INFORMATION STORAGE

Patents Applicationslast 30 patents

Information Patent Application
DUAL-PORT STATIC RANDOM ACCESS MEMORY CELL LAYOUT STRUCTURE
- Publication number 20210202494
- Publication date Jul 1, 2021
- Shanghai Huali Integrated Circuit Corporation
- Dongcheng WU
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
TESTING METHOD FOR READING CURRENT OF STATIC RANDOM ACCESS MEMORY
- Publication number 20190341121
- Publication date Nov 7, 2019
- Shanghai Huali Integrated Circuit Mfg. Co., Ltd.
- Pinhan CHEN
- G11 - INFORMATION STORAGE