DONGCHUL IHM

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SUWON-SI, KR

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Patents Grantslast 30 patents

Information Patent Grant
Inspection system of semiconductor wafer and method of driving the...
- Patent number 12,130,242
- Issue date Oct 29, 2024
- Samsung Electronics Co., Ltd.
- Doyoung Yoon
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Inspection system of semiconductor wafer and method of driving the...
- Patent number 11,754,510
- Issue date Sep 12, 2023
- Samsung Electronics Co., Ltd.
- Doyoung Yoon
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
System and method of inspecting substrate and method of fabricating...
- Patent number 10,393,672
- Issue date Aug 27, 2019
- Samsung Electronics Co., Ltd.
- Jeongho Ahn
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
INSPECTION SYSTEM OF SEMICONDUCTOR WAFER AND METHOD OF DRIVING THE...
- Publication number 20230384239
- Publication date Nov 30, 2023
- Samsung Electronics Co., Ltd.
- Doyoung YOON
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
INSPECTION SYSTEM OF SEMICONDUCTOR WAFER AND METHOD OF DRIVING THE...
- Publication number 20230123710
- Publication date Apr 20, 2023
- Samsung Electronics Co., Ltd.
- Doyoung YOON
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD OF GENERATING DEVICE STRUCTURE PREDICTION MODEL AND DEVICE S...
- Publication number 20230062430
- Publication date Mar 2, 2023
- Samsung Electronics Co., Ltd.
- Ami MA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SYSTEM AND METHOD OF INSPECTING SUBSTRATE AND METHOD OF FABRICATING...
- Publication number 20190033232
- Publication date Jan 31, 2019
- Samsung Electronics Co., Ltd.
- JEONGHO AHN
- G02 - OPTICS