Donghoon Han

Follow

Person

Alpharetta, GA, US

People

Patents Grantslast 30 patents

Information Patent Grant
Production test technique for RF circuits using embedded test sensors
- Patent number 7,554,335
- Issue date Jun 30, 2009
- Georgia Tech Research Corporation
- Donghoon Han
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Production test technique for RF circuits using embedded test sensors
- Publication number 20070033474
- Publication date Feb 8, 2007
- Georgia Tech Research Corporation
- Donghoon Han
- G01 - MEASURING TESTING