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Dongqi Li
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Beijing, CN
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Patents Grants
last 30 patents
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Patent Grant
Integrated electron beam tip and sample heating device for a scanni...
Patent number
7,427,755
Issue date
Sep 23, 2008
UChicago Argonne, LLC
Haifeng Ding
G01 - MEASURING TESTING
Patents Applications
last 30 patents
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Patent Application
Integrated electron beam tip and sample heating device for a scanni...
Publication number
20070029480
Publication date
Feb 8, 2007
The University of Chicago
Haifeng Ding
G01 - MEASURING TESTING