Doreen D. DiMilia

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Pleasantville, NY, US

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Patents Grantslast 30 patents

Information Patent Grant
Low-force wafer test probes
- Patent number 11,131,689
- Issue date Sep 28, 2021
- International Business Machines Corporation
- David M. Audette
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
In-situ monitoring of chemical vapor deposition process by mass spe...
- Patent number 7,094,614
- Issue date Aug 22, 2006
- International Business Machines Corporation
- Douglas S. Armbrust
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...

Patents Applicationslast 30 patents

Information Patent Application
PROCESSES FOR FABRICATING LOW-FORCE WAFER TEST PROBES AND THEIR STR...
- Publication number 20190227100
- Publication date Jul 25, 2019
- International Business Machines Corporation
- David M. Audette
- G01 - MEASURING TESTING
Information Patent Application
PROCESSES FOR FABRICATING LOW-FORCE WAFER TEST PROBES AND THEIR STR...
- Publication number 20180340958
- Publication date Nov 29, 2018
- International Business Machines Corporation
- David M. Audette
- G01 - MEASURING TESTING
Information Patent Application
PROCESSES FOR FABRICATING LOW-FORCE WAFER TEST PROBES AND THEIR STR...
- Publication number 20180340959
- Publication date Nov 29, 2018
- International Business Machines Corporation
- David M. Audette
- G01 - MEASURING TESTING
Information Patent Application
In-situ monitoring of chemical vapor deposition process by mass spe...
- Publication number 20020094681
- Publication date Jul 18, 2002
- Douglas S. Armbrust
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...