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Doris Chin
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Milpitas, CA, US
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last 30 patents
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Patent Grant
Selecting a hypothetical profile to use in optical metrology
Patent number
7,394,554
Issue date
Jul 1, 2008
Timbre Technologies, Inc.
Vi Vuong
G01 - MEASURING TESTING
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last 30 patents
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Patent Application
Selecting a hypothetical profile to use in optical metrology
Publication number
20050057748
Publication date
Mar 17, 2005
TimbreTechnologies, Inc.
Vi Vuong
G01 - MEASURING TESTING