Doron Korngut

Person

Modiin, IL

People

Patents Grantslast 30 patents

Information Patent Grant
Methods and systems for expediting multi-perspective wafer analysis
- Patent number 11,250,560
- Issue date Feb 15, 2022
- Applied Materials Israel Ltd.
- Doron Korngut
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Multi-perspective wafer analysis using an acousto-optic deflector
- Patent number 11,195,267
- Issue date Dec 7, 2021
- Applied Materials Israel Ltd.
- Harel Ilan
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Chuck for supporting a wafer
- Patent number 10,446,434
- Issue date Oct 15, 2019
- Applied Materials Israel Ltd.
- Doron Korngut
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Laser daylight designation and pointing
- Patent number 9,927,210
- Issue date Mar 27, 2018
- SHILAT OPTICAL SYSTEMS LTD.
- Avishay Guetta
- F41 - WEAPONS
Information Patent Grant
Evaluation system and a method for evaluating a substrate
- Patent number 9,835,563
- Issue date Dec 5, 2017
- Applied Materials Israel Ltd.
- Yoram Uziel
- G01 - MEASURING TESTING
Information Patent Grant
Terrain surveillance system
- Patent number 9,761,102
- Issue date Sep 12, 2017
- Shilat Optronics Ltd
- Avishay Guetta
- G08 - SIGNALLING
Information Patent Grant
Laser daylight designation and pointing
- Patent number 9,590,000
- Issue date Mar 7, 2017
- SHILAT OPTICAL SYSTEMS LTD.
- Avishay Guetta
- F41 - WEAPONS
Information Patent Grant
Intrusion warning system
- Patent number 8,970,374
- Issue date Mar 3, 2015
- Shilat Optronics Ltd
- Avishay Guetta
- G01 - MEASURING TESTING
Information Patent Grant
Field folding optical method for imaging system
- Patent number 7,586,596
- Issue date Sep 8, 2009
- Applied Materials, Israel, Ltd.
- Avishay Guetta
- G01 - MEASURING TESTING
Information Patent Grant
Speckle reduction with transparent blocks
- Patent number 7,586,959
- Issue date Sep 8, 2009
- Applied Materials, Israel, Ltd.
- Doron Korngut
- G02 - OPTICS
Information Patent Grant
Optical inspection with alternating configurations
- Patent number 7,397,552
- Issue date Jul 8, 2008
- Applied Materials, Israel, Ltd.
- Avishay Guetta
- G01 - MEASURING TESTING
Information Patent Grant
Dark field inspection system
- Patent number 7,339,661
- Issue date Mar 4, 2008
- Doron Korngut
- G01 - MEASURING TESTING
Information Patent Grant
Inspection system with oblique viewing angle
- Patent number 7,265,900
- Issue date Sep 4, 2007
- Applied Materials, Inc.
- Doron Korngut
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
METHODS AND SYSTEMS FOR EXPEDITING MULTI-PERSPECTIVE WAFER ANALYSIS
- Publication number 20220012862
- Publication date Jan 13, 2022
- APPLIED MATERIALS ISRAEL LTD.
- Doron Korngut
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
CHUCK FOR SUPPORTING A WAFER
- Publication number 20170309511
- Publication date Oct 26, 2017
- APPLIED MATERIALS ISRAEL LTD.
- Doron Korngut
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
LASER DAYLIGHT DESIGNATION AND POINTING
- Publication number 20170241746
- Publication date Aug 24, 2017
- SHILAT OPTRONICS LTD
- AVISHAY GUETTA
- F41 - WEAPONS
Information Patent Application
TERRAIN SURVEILLANCE SYSTEM
- Publication number 20140168633
- Publication date Jun 19, 2014
- Avishay Guetta
- G08 - SIGNALLING
Information Patent Application
LASER DAYLIGHT DESIGNATION AND POINTING
- Publication number 20130087684
- Publication date Apr 11, 2013
- Avishay Guetta
- F41 - WEAPONS
Information Patent Application
INTRUSION WARNING SYSTEM
- Publication number 20110043806
- Publication date Feb 24, 2011
- Avishay Guetta
- G08 - SIGNALLING
Information Patent Application
FIELD FOLDING OPTICAL METHOD FOR IMAGING SYSTEM
- Publication number 20070008520
- Publication date Jan 11, 2007
- APPLIED MATERIALS ISRAEL LTD.
- Avishay Guetta
- G01 - MEASURING TESTING
Information Patent Application
Speckle reduction with transparent blocks
- Publication number 20060066870
- Publication date Mar 30, 2006
- Doron Korngut
- G02 - OPTICS
Information Patent Application
Optical inspection with alternating configurations
- Publication number 20060066843
- Publication date Mar 30, 2006
- Avishay Guetta
- G01 - MEASURING TESTING
Information Patent Application
Dark field inspection system
- Publication number 20050219518
- Publication date Oct 6, 2005
- Doron Korngut
- G01 - MEASURING TESTING

Doron Korngut

Person

Patents Grantslast 30 patents

Methods and systems for expediting multi-perspective wafer analysis

Multi-perspective wafer analysis using an acousto-optic deflector

Chuck for supporting a wafer

Laser daylight designation and pointing

Evaluation system and a method for evaluating a substrate

Terrain surveillance system

Laser daylight designation and pointing

Intrusion warning system

Field folding optical method for imaging system

Speckle reduction with transparent blocks

Optical inspection with alternating configurations

Dark field inspection system

Inspection system with oblique viewing angle

Patents Applicationslast 30 patents

METHODS AND SYSTEMS FOR EXPEDITING MULTI-PERSPECTIVE WAFER ANALYSIS

CHUCK FOR SUPPORTING A WAFER

LASER DAYLIGHT DESIGNATION AND POINTING

TERRAIN SURVEILLANCE SYSTEM

LASER DAYLIGHT DESIGNATION AND POINTING

INTRUSION WARNING SYSTEM

FIELD FOLDING OPTICAL METHOD FOR IMAGING SYSTEM

Speckle reduction with transparent blocks

Optical inspection with alternating configurations

Dark field inspection system