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Doron Meshulach
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Ramat-Gan, IL
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Patents Grants
last 30 patents
Information
Patent Grant
Mapping variations of a surface
Patent number
8,724,882
Issue date
May 13, 2014
Applied Materials Israel, Ltd.
Doron Meshulach
G01 - MEASURING TESTING
Information
Patent Grant
Optical system and method for inspection of patterned samples
Patent number
8,614,790
Issue date
Dec 24, 2013
Applied Materials Israel, Ltd.
Yoav Berlatzky
G01 - MEASURING TESTING
Information
Patent Grant
Scanning microscopy using inhomogeneous polarization
Patent number
8,228,601
Issue date
Jul 24, 2012
Applied Materials Israel, Ltd.
Doron Meshulach
G02 - OPTICS
Information
Patent Grant
High throughput across-wafer-variation mapping
Patent number
7,990,546
Issue date
Aug 2, 2011
Applied Materials Israel, Ltd.
Jeong Ho Yeo
G01 - MEASURING TESTING
Information
Patent Grant
High resolution printer and a method for high resolution printing
Patent number
7,846,649
Issue date
Dec 7, 2010
Applied Materials Israel, Ltd.
Ehud Tirosh
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Grant
Raster frame beam system for electron beam lithography
Patent number
7,842,935
Issue date
Nov 30, 2010
Applied Materials Israel, Ltd.
Meir Aloni
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Grant
Scanning microscopy
Patent number
7,684,048
Issue date
Mar 23, 2010
Applied Materials Israel, Ltd.
Doron Meshulach
G01 - MEASURING TESTING
Information
Patent Grant
One-dimensional phase contrast microscopy with a traveling lens gen...
Patent number
7,576,348
Issue date
Aug 18, 2009
Applied Materials, Israel, Ltd.
Haim Feldman
G01 - MEASURING TESTING
Information
Patent Grant
Raster frame beam system for electron beam lithography
Patent number
7,521,700
Issue date
Apr 21, 2009
Applied Materials, Israel, Ltd.
Meir Aloni
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Grant
Optical spot grid array scanning system
Patent number
7,468,507
Issue date
Dec 23, 2008
Applied Materials, Israel, Ltd.
Steven R. Rogers
G01 - MEASURING TESTING
Information
Patent Grant
Raster frame beam system for electron beam lithography
Patent number
7,098,468
Issue date
Aug 29, 2006
Applied Materials, Inc.
Meir Aloni
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Patents Applications
last 30 patents
Information
Patent Application
OPTICAL SYSTEM AND METHOD FOR INSPECTION OF PATTERNED SAMPLES
Publication number
20130148114
Publication date
Jun 13, 2013
Yoav Berlatzky
G01 - MEASURING TESTING
Information
Patent Application
OPTICAL SYSTEM AND METHOD FOR INSPECTION OF PATTERNED SAMPLES
Publication number
20130148115
Publication date
Jun 13, 2013
Yoav Berlatzky
G01 - MEASURING TESTING
Information
Patent Application
MAPPING VARIATIONS OF A SURFACE
Publication number
20110158502
Publication date
Jun 30, 2011
Doron Meshulach
G01 - MEASURING TESTING
Information
Patent Application
SCANNING MICROSCOPY USING INHOMOGENEOUS POLARIZATION
Publication number
20090284835
Publication date
Nov 19, 2009
Doron Meshulach
G02 - OPTICS
Information
Patent Application
HIGH THROUGHPUT ACROSS-WAFER-VARIATION MAPPING
Publication number
20090021749
Publication date
Jan 22, 2009
Jeong Ho Yeo
G01 - MEASURING TESTING
Information
Patent Application
ONE-DIMENSIONAL PHASE CONTRAST MICROSCOPY
Publication number
20080116362
Publication date
May 22, 2008
APPLIED MATERIALS, ISRAEL, LTD.
Haim Feldman
G01 - MEASURING TESTING
Information
Patent Application
Optical spot grid array scanning system
Publication number
20070133077
Publication date
Jun 14, 2007
Steven R. Rogers
G01 - MEASURING TESTING
Information
Patent Application
Scanning Microscopy
Publication number
20070109546
Publication date
May 17, 2007
Doron Meshulach
G01 - MEASURING TESTING
Information
Patent Application
Raster Frame Beam System For Electron Beam Lithography
Publication number
20060243918
Publication date
Nov 2, 2006
Meir Aloni
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Application
Raster Frame Beam System For Electron Beam Lithography
Publication number
20060243922
Publication date
Nov 2, 2006
Meir Aloni
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Application
High resolution printer and a method for high resolution printing
Publication number
20060055911
Publication date
Mar 16, 2006
Applied Materials Israel Ltd.
Ehud Tirosh
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Application
Raster frame beam system for electron beam lithography
Publication number
20050274911
Publication date
Dec 15, 2005
Meir Aloni
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY