Doron Pardess

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Migdal Haemek, IL

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Patents Grantslast 30 patents

Information Patent Grant
High-resolution integrated X-ray CMOS image sensor
- Patent number 8,501,573
- Issue date Aug 6, 2013
- Tower Semiconductor Ltd.
- Yakov Roizin
- G01 - MEASURING TESTING
Information Patent Grant
High resolution integrated X-ray CMOS image sensor
- Patent number 7,608,837
- Issue date Oct 27, 2009
- Tower Semiconductor Ltd.
- Yakov Roizin
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
High-Resolution Integrated X-Ray CMOS Image Sensor
- Publication number 20090181491
- Publication date Jul 16, 2009
- Tower Semiconductor Ltd.
- Yakov Roizin
- G01 - MEASURING TESTING
Information Patent Application
High Resolution Integrated X-Ray CMOS Image Sensor
- Publication number 20080121808
- Publication date May 29, 2008
- Tower Semiconductor Ltd.
- Yakov Roizin
- G01 - MEASURING TESTING