Doron Shoham

Person

Rehovot, IL

People

Patents Grantslast 30 patents

Information Patent Grant
Inspection method and an inspection system exhibiting speckle reduc...
- Patent number 9,012,875
- Issue date Apr 21, 2015
- Applied Materials Israel, Ltd.
- Amir Shoham
- G01 - MEASURING TESTING
Information Patent Grant
Illumination system for optical inspection
- Patent number 8,134,699
- Issue date Mar 13, 2012
- Applied Materials, Inc.
- Ron Naftali
- G01 - MEASURING TESTING
Information Patent Grant
Illumination system for optical inspection
- Patent number 7,924,419
- Issue date Apr 12, 2011
- Applied Materials Israel, Ltd.
- Ron Naftali
- G01 - MEASURING TESTING
Information Patent Grant
Illumination system for optical inspection
- Patent number 7,630,069
- Issue date Dec 8, 2009
- Applied Materials, Inc.
- Ron Naftali
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for inspecting a sample having a controller fo...
- Patent number 7,504,647
- Issue date Mar 17, 2009
- Applied Materials, Inc.
- Gal Amar
- G01 - MEASURING TESTING
Information Patent Grant
Process and assembly for non-destructive surface inspection
- Patent number 7,463,351
- Issue date Dec 9, 2008
- Applied Materials, Inc.
- Gilad Almogy
- G01 - MEASURING TESTING
Information Patent Grant
Optical inspection with alternating configurations
- Patent number 7,397,552
- Issue date Jul 8, 2008
- Applied Materials, Israel, Ltd.
- Avishay Guetta
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for inspecting a sample having a height measur...
- Patent number 7,115,890
- Issue date Oct 3, 2006
- Applied Materials, Inc.
- Gal Amar
- G01 - MEASURING TESTING
Information Patent Grant
Wafer inspection methods and an optical inspection tool
- Patent number 7,042,564
- Issue date May 9, 2006
- Applied Materials, Israel, Ltd.
- Doron Shoham
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
System and method for inspection of a substrate that has a refracti...
- Patent number 7,030,978
- Issue date Apr 18, 2006
- Applied Materials, Israel, Ltd.
- Avishay Guetta
- G01 - MEASURING TESTING
Information Patent Grant
Process and assembly for non-destructive surface inspection
- Patent number 6,861,660
- Issue date Mar 1, 2005
- Applied Materials, Inc.
- Gilad Almogy
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
DRONE OPTICAL GUIDANCE SYSTEM
- Publication number 20220013020
- Publication date Jan 13, 2022
- SHILAT OPTRONICS LTD
- Avishai GUETTA
- B64 - AIRCRAFT AVIATION COSMONAUTICS
Information Patent Application
INSPECTION METHOD AND AN INSPECTION SYSTEM EXHIBITING SPECKLE REDUC...
- Publication number 20140299790
- Publication date Oct 9, 2014
- APPLIED MATERIALS ISRAEL, LTD.
- Amir Shoham
- G01 - MEASURING TESTING
Information Patent Application
ILLUMINATION SYSTEM FOR OPTICAL INSPECTION
- Publication number 20110170090
- Publication date Jul 14, 2011
- Ron Naftali
- G01 - MEASURING TESTING
Information Patent Application
ILLUMINATION SYSTEM FOR OPTICAL INSPECTION
- Publication number 20100097680
- Publication date Apr 22, 2010
- Ron Naftali
- G01 - MEASURING TESTING
Information Patent Application
Inspection System with Auto-Focus
- Publication number 20070034773
- Publication date Feb 15, 2007
- Gal Amar
- G01 - MEASURING TESTING
Information Patent Application
Illumination system for optical inspection
- Publication number 20070008519
- Publication date Jan 11, 2007
- APPLIED MATERIALS, INC.
- Ron Naftali
- G01 - MEASURING TESTING
Information Patent Application
Optical inspection with alternating configurations
- Publication number 20060066843
- Publication date Mar 30, 2006
- Avishay Guetta
- G01 - MEASURING TESTING
Information Patent Application
Process and assmebly for non-destructive surface inspection
- Publication number 20050179891
- Publication date Aug 18, 2005
- Gilad Almogy
- G01 - MEASURING TESTING
Information Patent Application
Inspection system with auto-focus
- Publication number 20050167568
- Publication date Aug 4, 2005
- Gal Amar
- G01 - MEASURING TESTING
Information Patent Application
System and method for inspection of a substrate that has a refracti...
- Publication number 20040246474
- Publication date Dec 9, 2004
- Applied Materials Israel Ltd.
- Avishay Guetta
- G01 - MEASURING TESTING
Information Patent Application
Wafer inspection methods and an optical inspection tool
- Publication number 20040028267
- Publication date Feb 12, 2004
- Applied Materials Israel Ltd.
- Doron Shoham
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Process and assembly for non-destructive surface inspection
- Publication number 20040016896
- Publication date Jan 29, 2004
- Applied Materials Israel, Inc.
- Gilad Almogy
- G01 - MEASURING TESTING

Doron Shoham

Person

Patents Grantslast 30 patents

Inspection method and an inspection system exhibiting speckle reduc...

Illumination system for optical inspection

Illumination system for optical inspection

Illumination system for optical inspection

Method and apparatus for inspecting a sample having a controller fo...

Process and assembly for non-destructive surface inspection

Optical inspection with alternating configurations

Method and apparatus for inspecting a sample having a height measur...

Wafer inspection methods and an optical inspection tool

System and method for inspection of a substrate that has a refracti...

Process and assembly for non-destructive surface inspection

Patents Applicationslast 30 patents

DRONE OPTICAL GUIDANCE SYSTEM

INSPECTION METHOD AND AN INSPECTION SYSTEM EXHIBITING SPECKLE REDUC...

ILLUMINATION SYSTEM FOR OPTICAL INSPECTION

ILLUMINATION SYSTEM FOR OPTICAL INSPECTION

Inspection System with Auto-Focus

Illumination system for optical inspection

Optical inspection with alternating configurations

Process and assmebly for non-destructive surface inspection

Inspection system with auto-focus

System and method for inspection of a substrate that has a refracti...

Wafer inspection methods and an optical inspection tool

Process and assembly for non-destructive surface inspection