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Doruk Senkal
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San Jose, CA, US
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Patents Grants
last 30 patents
Information
Patent Grant
Drive and sense balanced, semi-coupled 3-axis gyroscope
Patent number
11,815,354
Issue date
Nov 14, 2023
Invensense, Inc.
Doruk Senkal
G01 - MEASURING TESTING
Information
Patent Grant
Demodulation phase calibration using external input
Patent number
11,650,078
Issue date
May 16, 2023
Invensense, Inc.
Doruk Senkal
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Grant
Demodulation phase calibration using external input
Patent number
11,365,983
Issue date
Jun 21, 2022
Invensense, Inc.
Doruk Senkal
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Grant
Microelectromechanical systems (MEMS) gyroscope calibration
Patent number
10,996,075
Issue date
May 4, 2021
Invensense, Inc.
Sriraman Dakshinamurthy
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Grant
Drive and sense balanced, semi-coupled 3-axis gyroscope
Patent number
10,914,584
Issue date
Feb 9, 2021
Invensense, Inc.
Doruk Senkal
G01 - MEASURING TESTING
Information
Patent Grant
On-chip gap measurement
Patent number
10,794,702
Issue date
Oct 6, 2020
Invensense, Inc.
Doruk Senkal
G01 - MEASURING TESTING
Information
Patent Grant
Demodulation phase calibration
Patent number
10,746,565
Issue date
Aug 18, 2020
Invensense, Inc.
Doruk Senkal
G01 - MEASURING TESTING
Information
Patent Grant
Demodulation phase calibration
Patent number
10,267,650
Issue date
Apr 23, 2019
Invensense, Inc.
Doruk Senkal
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
DRIVE AND SENSE BALANCED, SEMI-COUPLED 3-AXIS GYROSCOPE
Publication number
20230324176
Publication date
Oct 12, 2023
InvenSense, Inc.
Doruk Senkal
G01 - MEASURING TESTING
Information
Patent Application
DEMODULATION PHASE CALIBRATION USING EXTERNAL INPUT
Publication number
20220326045
Publication date
Oct 13, 2022
InvenSense, Inc.
Doruk Senkal
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Application
DRIVE AND SENSE BALANCED, SEMI-COUPLED 3-AXIS GYROSCOPE
Publication number
20210116244
Publication date
Apr 22, 2021
InvenSense, Inc.
Doruk Senkal
G01 - MEASURING TESTING
Information
Patent Application
DEMODULATION PHASE CALIBRATION
Publication number
20190226871
Publication date
Jul 25, 2019
InvenSense, Inc.
Doruk Senkal
G01 - MEASURING TESTING
Information
Patent Application
MICROELECTROMECHANICAL SYSTEMS (MEMS) GYROSCOPE CALIBRATION
Publication number
20190186950
Publication date
Jun 20, 2019
InvenSense, Inc.
Sriraman Dakshinamurthy
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Application
ON-CHIP GAP MEASUREMENT
Publication number
20190178645
Publication date
Jun 13, 2019
InvenSense, Inc.
Doruk Senkal
G01 - MEASURING TESTING
Information
Patent Application
STRESS ISOLATION FRAME FOR A SENSOR
Publication number
20190169018
Publication date
Jun 6, 2019
InvenSense, Inc.
Doruk SENKAL
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Application
DEMODULATION PHASE CALIBRATION USING EXTERNAL INPUT
Publication number
20190120657
Publication date
Apr 25, 2019
InvenSense, Inc.
Doruk Senkal
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Application
DRIVE AND SENSE BALANCED, SEMI-COUPLED 3-AXIS GYROSCOPE
Publication number
20180216935
Publication date
Aug 2, 2018
InvenSense, Inc.
Doruk Senkal
G01 - MEASURING TESTING
Information
Patent Application
DEMODULATION PHASE CALIBRATION
Publication number
20170350722
Publication date
Dec 7, 2017
InvenSense, Inc.
Doruk Senkal
G01 - MEASURING TESTING