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Doug Gotthard
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Santa Barbara, CA, US
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Patents Grants
last 30 patents
Information
Patent Grant
Devices, systems, and methods for reducing microbial load during pr...
Patent number
11,813,636
Issue date
Nov 14, 2023
aPEEL Technology, Inc.
Ronald C. Bakus
B05 - SPRAYING OR ATOMISING IN GENERAL APPLYING LIQUIDS OR OTHER FLUENT MATER...
Information
Patent Grant
Nanoscale infrared spectroscopy with multi-frequency atomic force m...
Patent number
10,557,789
Issue date
Feb 11, 2020
Bruker Nano, Inc.
Craig Prater
G01 - MEASURING TESTING
Information
Patent Grant
Magnetic actuation and thermal cantilevers for temperature and freq...
Patent number
8,914,911
Issue date
Dec 16, 2014
The Board of Trustees of the University of Illinois
William P. King
B82 - NANO-TECHNOLOGY
Information
Patent Grant
Dynamic power control, beam alignment and focus for nanoscale spect...
Patent number
8,242,448
Issue date
Aug 14, 2012
Anasys Instruments Corporation
Craig Prater
B82 - NANO-TECHNOLOGY
Information
Patent Grant
Transition temperature microscopy
Patent number
8,177,422
Issue date
May 15, 2012
Anasys Instruments
Kevin Kjoller
B82 - NANO-TECHNOLOGY
Information
Patent Grant
Optical detection alignment/tracking method and apparatus
Patent number
7,478,552
Issue date
Jan 20, 2009
Veeco Instruments Inc.
Doug Gotthard
G01 - MEASURING TESTING
Information
Patent Grant
Method of making a force curve measurement on a sample
Patent number
7,387,035
Issue date
Jun 17, 2008
Veeco Instruments Inc.
Jens Struckmeier
G01 - MEASURING TESTING
Information
Patent Grant
Force scanning probe microscope
Patent number
7,044,007
Issue date
May 16, 2006
Veeco Instruments Inc.
Jens Struckmeier
G01 - MEASURING TESTING
Information
Patent Grant
Manual control with force-feedback for probe microscopy-based force...
Patent number
7,013,717
Issue date
Mar 21, 2006
Veeco Instruments Inc.
Jens Struckmeier
G01 - MEASURING TESTING
Information
Patent Grant
Force scanning probe microscope
Patent number
6,677,697
Issue date
Jan 13, 2004
Veeco Instruments Inc.
Jens Struckmeier
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
DEVICES, SYSTEMS, AND METHODS FOR REDUCING MICROBIAL LOAD DURING PR...
Publication number
20240058832
Publication date
Feb 22, 2024
aPEEL Technology, Inc.
Ronald C. Bakus
A23 - FOODS OR FOODSTUFFS THEIR TREATMENT, NOT COVERED BY OTHER CLASSES
Information
Patent Application
DEVICES, SYSTEMS, AND METHODS FOR REDUCING MICROBIAL LOAD DURING PR...
Publication number
20220297153
Publication date
Sep 22, 2022
aPEEL Technology, Inc.
Ronald C. Bakus
C09 - DYES PAINTS POLISHES NATURAL RESINS ADHESIVES MISCELLANEOUS COMPOSITION...
Information
Patent Application
Nanoscale infrared spectroscopy with multi-frequency atomic force m...
Publication number
20150034826
Publication date
Feb 5, 2015
Craig Prater
G01 - MEASURING TESTING
Information
Patent Application
Dynamic power control, beam alignment and focus for nanoscale spect...
Publication number
20110205527
Publication date
Aug 25, 2011
Anasys Instruments Inc.
Craig Prater
G01 - MEASURING TESTING
Information
Patent Application
Transition temperature microscopy
Publication number
20100042356
Publication date
Feb 18, 2010
Kevin Kjoller
G01 - MEASURING TESTING
Information
Patent Application
Optical detection alignment/tracking method and apparatus
Publication number
20070220958
Publication date
Sep 27, 2007
Veeco Instruments Inc.
Doug Gotthard
G01 - MEASURING TESTING
Information
Patent Application
FORCE SCANNING PROBE MICROSCOPE
Publication number
20060283240
Publication date
Dec 21, 2006
Jens Struckmeier
G01 - MEASURING TESTING
Information
Patent Application
Force scanning probe microscope
Publication number
20050081610
Publication date
Apr 21, 2005
Jens Struckmeier
G01 - MEASURING TESTING
Information
Patent Application
Force scanning probe microscope
Publication number
20030110844
Publication date
Jun 19, 2003
Veeco Instruments Inc.
Jens Struckmeier
G01 - MEASURING TESTING